
Optical Engineering
Image quality of sparse aperture designs for remote sensingFormat | Member Price | Non-Member Price |
---|---|---|
$20.00 | $25.00 |
![]() |
GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. | Check Access |
Paper Details
Date Published: 1 August 2002
PDF: 13 pages
Opt. Eng. 41(8) doi: 10.1117/1.1490555
Published in: Optical Engineering Volume 41, Issue 8
PDF: 13 pages
Opt. Eng. 41(8) doi: 10.1117/1.1490555
Published in: Optical Engineering Volume 41, Issue 8
Show Author Affiliations
Robert D. Fiete, Eastman Kodak Co. (United States)
Theodore A. Tantalo, Eastman Kodak Co. (United States)
Theodore A. Tantalo, Eastman Kodak Co. (United States)
Jason R. Calus, Eastman Kodak Co. (United States)
James A. Mooney, Eastman Kodak Co. (United States)
James A. Mooney, Eastman Kodak Co. (United States)
© SPIE. Terms of Use
