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Optical Engineering

Photorefractive recording of subwavelength-size binary data using near-field scanning optical microscopy
Author(s): Kyoung-Youm Kim; Jingu Kang; Byoungho Lee
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Paper Abstract

We propose a way of single-beam photorefractive recording of subwavelength-size binary optical data using near-field scanning optical microscopy (NSOM). Data are recorded in the form of pure (without any change in the topography of the surface) refractive index changes induced near the surface of photorefractive crystal by the light intensity distribution from the subwavelength-size fiber tip of the NSOM. This change in the refractive index can modify the transmission characteristics of the NSOM. Therefore, the characteristics of the reading beam depend on whether the light from the tapered fiber tip was previously exposed (recorded) or not, and thus can be regarded as on-off (binary) data.

Paper Details

Date Published: 1 August 2002
PDF: 7 pages
Opt. Eng. 41(8) doi: 10.1117/1.1488605
Published in: Optical Engineering Volume 41, Issue 8
Show Author Affiliations
Kyoung-Youm Kim, Seoul National Univ. (South Korea)
Jingu Kang, Seoul National Univ. (South Korea)
Byoungho Lee, Seoul National Univ. (South Korea)

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