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Optical Engineering

Electromagnetic analysis of finite thickness diffractive elements
Author(s): Dennis W. Prather; Shouyuan Shi; Jay Sonstroem
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Paper Abstract

We present an electromagnetic analysis of diffractive optical elements (DOEs) fabricated on finite-thickness substrates. To this end we use the finite-difference time-domain (FDTD) method to solve the electromagnetic boundary value problem in the vicinity of the DOE and a semi-infinite propagation algorithm to determine the diffracted fields on the output side of the substrate. The formulation of the method and its application to the analysis of several finite-thickness diffractive lenses is presented.

Paper Details

Date Published: 1 August 2002
PDF: 5 pages
Opt. Eng. 41(8) doi: 10.1117/1.1487856
Published in: Optical Engineering Volume 41, Issue 8
Show Author Affiliations
Dennis W. Prather, Univ. of Delaware (United States)
Shouyuan Shi, Univ. of Delaware (United States)
Jay Sonstroem, U.S. Army Night Vision Lab. (United States)

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