Share Email Print

Optical Engineering

Electromagnetic analysis of finite thickness diffractive elements
Author(s): Dennis W. Prather; Shouyuan Shi; Jay Sonstroem
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 August 2002
PDF: 5 pages
Opt. Eng. 41(8) doi: 10.1117/1.1487856
Published in: Optical Engineering Volume 41, Issue 8
Show Author Affiliations
Dennis W. Prather, Univ. of Delaware (United States)
Shouyuan Shi, Univ. of Delaware (United States)
Jay Sonstroem, U.S. Army Night Vision Lab. (United States)

© SPIE. Terms of Use
Back to Top