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Optical Engineering

Equivalent complex refractive indices for ray-tracing evaluation of dielectric-coated hollow waveguides
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Paper Details

Date Published: 1 July 2002
PDF: 2 pages
Opt. Eng. 41(7) doi: 10.1117/1.1485090
Published in: Optical Engineering Volume 41, Issue 7
Show Author Affiliations
Katsumasa Iwai, Tohoku Univ. (Japan)
Yukio Abe, Tohoku Univ. (Japan)
Yuji Matsuura, Tohoku Univ. (Japan)
Mitsunobu Miyagi, Tohoku Univ. (Japan)


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