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Optical Engineering

Equivalent complex refractive indices for ray-tracing evaluation of dielectric-coated hollow waveguides
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Paper Abstract

An idea of an equivalent refractive index for the ray tracing calculation of hollow core waveguides is proposed. A virtual, complex refractive index is uniquely found by minimizing the difference between reflectivity of a virtual monolayer material and a metal substrate coated with a dielectric film. By using this technique, transmission losses of a delivery system consisting of a hollow fiber and a tapered hollow waveguide are calculated.

Paper Details

Date Published: 1 July 2002
PDF: 2 pages
Opt. Eng. 41(7) doi: 10.1117/1.1485090
Published in: Optical Engineering Volume 41, Issue 7
Show Author Affiliations
Katsumasa Iwai, Tohoku Univ. (Japan)
Yukio Abe, Tohoku Univ. (Japan)
Yuji Matsuura, Tohoku Univ. (Japan)
Mitsunobu Miyagi, Tohoku Univ. (Japan)


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