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Optical Engineering

Quantitative measurement for the modulation of photorefractive index gratings
Author(s): Shoang C. Donn; Chung-Chen Tu; Ching-Cherng Sun; Ming-Tsung Chen
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Paper Abstract

The modulation of a photorefractive index grating, ?n, can be estimated by counting the number of peaks in the curve for the diffraction efficiency as a function of time under the phase matching condition. The accuracy for this method is about 13%. Here a new method is proposed, in which we improve the measurement accuracy to about 1%, by adding the measurement for the diffraction efficiency as a function of the angle mismatch. This precise ?n measurement allows us to quantify photorefractive effects with greater accuracy.

Paper Details

Date Published: 1 June 2002
PDF: 4 pages
Opt. Eng. 41(6) doi: 10.1117/1.1476941
Published in: Optical Engineering Volume 41, Issue 6
Show Author Affiliations
Shoang C. Donn, Chung Yuan Univ. (Taiwan)
Chung-Chen Tu, Chung Yuan Univ. (Taiwan)
Ching-Cherng Sun, National Central Univ. (Taiwan)
Ming-Tsung Chen, Chung Yuan Univ. (Taiwan)

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