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Optical Engineering

Subpixel sensitivity maps for a back-illuminated charge-coupled device and the effects of nonuniform response on measurement
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Paper Details

Date Published: 1 June 2002
PDF: 11 pages
Opt. Eng. 41(6) doi: 10.1117/1.1476691
Published in: Optical Engineering Volume 41, Issue 6
Show Author Affiliations
Albert Piterman, Rochester Institute of Technology (United States)
Zoran Ninkov, Rochester Institute of Technology (United States)


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