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Optical Engineering

Analysis of the wavelength-to-depth encoded interference microscopy for three-dimensional imaging
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Paper Details

Date Published: 1 June 2002
PDF: 8 pages
Opt. Eng. 41(6) doi: 10.1117/1.1474439
Published in: Optical Engineering Volume 41, Issue 6
Show Author Affiliations
Guoqiang Li, Univ. of California/San Diego (United States)
Yeshaiahu Fainman, Univ. of California/San Diego (United States)


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