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Optical Engineering

Calibration and exploitation of a narrowband imaging polarimeter
Author(s): Michael J. Duggin; Richard S. Loe
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Paper Details

Date Published: 1 May 2002
PDF: 9 pages
Opt. Eng. 41(5) doi: 10.1117/1.1467935
Published in: Optical Engineering Volume 41, Issue 5
Show Author Affiliations
Michael J. Duggin, SUNY/Syracuse and PAR Government Systems Corp. (United States)
Richard S. Loe, PAR Government Systems Corp. (United States)


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