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Optical Engineering

Polarimetric microfacet scattering theory with applications to absorptive and reflective surfaces
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Paper Abstract

We investigate the polarimetric scattering properties of highly absorbing and highly reflective rough surfaces in the IR. We obtain Mueller matrix measurements from these surfaces and compare the data to a Fresnel model. From the data, we determine that a rough, highly absorbing surface has a higher degree of polarization compared to a rough, highly reflective surface. In addition, we present a full polarimetric version of the microfacet model and discuss its properties. This closed-form result for the polarimetric bidirectional reflectance distribution function (BRDF) is derived from the microfacet model.

Paper Details

Date Published: 1 May 2002
PDF: 6 pages
Opt. Eng. 41(5) doi: 10.1117/1.1467360
Published in: Optical Engineering Volume 41, Issue 5
Show Author Affiliations
Richard G. Priest, Naval Research Lab. (United States)
Steven R. Meier, Naval Research Lab. (United States)

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