Share Email Print
cover

Optical Engineering

In-situ ER-doped GaN optical storage devices using high-resolution focused ion beam milling
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 April 2002
PDF: 2 pages
Opt. Eng. 41(4) doi: 10.1117/1.1461833
Published in: Optical Engineering Volume 41, Issue 4
Show Author Affiliations
Boon Kwee Lee, Univ. of Cincinnati (United States)
Chih-Jen Chi, Univ. of Cincinnati (United States)
Irving Chyr, Univ. of Cincinnati (United States)
Dong-Seon Lee, Univ. of Cincinnati (United States)
Fred Richard Beyette, Univ. of Cincinnati (United States)
Andrew J. Steckl, Univ. of Cincinnati (United States)


© SPIE. Terms of Use
Back to Top