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Optical Engineering

New wavelet transforms for noise insensitive edge detection
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Paper Abstract

Two new wavelet transforms for noise-insensitive edge detection are analyzed and discussed. The proposed method is useful for lead inspection of surface mount devices in the electronic industry.

Paper Details

Date Published: 1 January 2002
PDF: 5 pages
Opt. Eng. 41(1) doi: 10.1117/1.1424877
Published in: Optical Engineering Volume 41, Issue 1
Show Author Affiliations
Feijun Song, China Daheng Corp. (China)
Suganda Jutamulia, Blue Sky Research (United States)

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