Share Email Print
cover

Optical Engineering

Comparative study of wavelet thresholding methods for denoising electronic speckle pattern interferometry fringes
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 November 2001
PDF: 7 pages
Opt. Eng. 40(11) doi: 10.1117/1.1412616
Published in: Optical Engineering Volume 40, Issue 11
Show Author Affiliations
Alejandro Federico, Instituto Nacional de Tecnologia Industrial (Argentina)
Guillermo H. Kaufmann, Univ. Nacional de Rosario (Argentina)


© SPIE. Terms of Use
Back to Top