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Optical Engineering

Comparative study of wavelet thresholding methods for denoising electronic speckle pattern interferometry fringes
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Paper Abstract

This paper presents a comparative study of different thresholding methods for speckle noise reduction in electronic speckle pattern interferometry fringes using several wavelet bases. An approach based on the removal of the wavelet subbands of the transformed image is presented. The performance of this method is analyzed and compared with the results obtained with the denoising techniques that use wavelet shrinkage. It is shown that the wavelet subband removal method reduces speckle noise and maintains image features more effectively than the wavelet shrinkage techniques based on soft and hard thresholding.

Paper Details

Date Published: 1 November 2001
PDF: 7 pages
Opt. Eng. 40(11) doi: 10.1117/1.1412616
Published in: Optical Engineering Volume 40, Issue 11
Show Author Affiliations
Alejandro Federico, Instituto Nacional de Tecnologia Industrial (Argentina)
Guillermo H. Kaufmann, Univ. Nacional de Rosario (Argentina)

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