Share Email Print

Optical Engineering

Surface imperfections: specimen measurement by microscope and digital camera
Author(s): Lionel R. Baker
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An existing design of a microscope image comparator (MIC) for the measurement of surface imperfections, referenced in International Organisation for Standardization (ISO) 10110-7:1996, is judged too costly for use by small companies manufacturing optical components. A simple stripped-down version of the MlC using components recently made available in most laboratories is described. The use of the instrument is demonstrated by measurement of imperfections on two samples of scratch and dig paddle.

Paper Details

Date Published: 1 October 2001
PDF: 2 pages
Opt. Eng. 40(10) doi: 10.1117/1.1405159
Published in: Optical Engineering Volume 40, Issue 10
Show Author Affiliations
Lionel R. Baker

© SPIE. Terms of Use
Back to Top