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Optical Engineering

Spectral imaging, reflectivity measurements, and modeling of iridescent butterfly scale structures
Author(s): Seth E. Mann; Ioannis N. Miaoulis; Peter Y. Wong
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Paper Details

Date Published: 1 October 2001
PDF: 8 pages
Opt. Eng. 40(10) doi: 10.1117/1.1404431
Published in: Optical Engineering Volume 40, Issue 10
Show Author Affiliations
Seth E. Mann, Tufts Univ. (United States)
Ioannis N. Miaoulis, Tufts Univ. (United States)
Peter Y. Wong, Tufts Univ. (United States)

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