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Optical Engineering

Phase errors in low-frequency vibration measurement with high-speed phase-shifting speckle pattern interferometry
Author(s): Pablo D. Ruiz; Jonathan Mark Huntley; Y. Shen; C. R. Coggrave; Guillermo H. Kaufmann
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Paper Abstract

When mechanical vibrations are measured by means of a dynamic phase-shifting speckle pattern interferometer, the deformation can be tracked with an error that depends on the amplitude and frequency of the vibration. We use a numerical simulation based on a detailed mathematical model of the system to predict the expected frequency response of the root mean square (rms) measurement error in the time-varying phase difference maps. The performance of four phase- shifting algorithms (three-frame, four-frame, Carre, and Schwider- Hariharan five-frame) and a temporal phase unwrapping method is studied over a range of vibrational amplitudes and frequencies. The numerical results indicate that the Carre algorithm is the preferred phase-shifting method to measure vibrations with a dynamic electronic speckle pattern interferometry (ESPI) system. Vibration frequencies up to 30% of the carrier frequency can be measured with an rms phase change error less than l0% of the vibration amplitude. The numerical results are finally compared with experimental data, acquired using a 1000 frame/s phase-shifting speckle interferometer together with a laser vibrometer, which provides a reference phase measure.

Paper Details

Date Published: 1 September 2001
PDF: 9 pages
Opt. Eng. 40(9) doi: 10.1117/1.1397764
Published in: Optical Engineering Volume 40, Issue 9
Show Author Affiliations
Pablo D. Ruiz, Univ. Nacional de Rosario (Argentina)
Jonathan Mark Huntley, Loughborough Univ. (United Kingdom)
Y. Shen, Loughborough Univ. (United Kingdom)
C. R. Coggrave, Univ. of Loughborough (United Kingdom)
Guillermo H. Kaufmann, Univ. Nacional de Rosario (Argentina)

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