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Optical Engineering

Image-based contrast-to-clutter modeling of detection
Author(s): David L. Wilson
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Paper Abstract

Using image-based metrics, a contrast-to-clutter model is applied to a visible imagery set and perception experiment data. To calculate the contrast metric, a new image is generated from a gray scale version of the original image by replacing the target with an expected background using the local background surrounding the target. The contrast metric is obtained from the difference of this new image and the original image. Via a simple mathematical formula, the ratio of the contrast measure to a clutter metric is used to predict performance.

Paper Details

Date Published: 1 September 2001
PDF: 6 pages
Opt. Eng. 40(9) doi: 10.1117/1.1389502
Published in: Optical Engineering Volume 40, Issue 9
Show Author Affiliations
David L. Wilson, U.S. Army Night Vision Electronic Sensors Directorate (United States)

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