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Optical Engineering

Spectral effects of sampling a continuous-scan Fourier transform spectrometer with a capacitive transimpedance amplifier (CTIA)
Author(s): W. Todd Hurt
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Paper Abstract

In a Michelson interferometer, an incident beam of light ~typically at infrared wavelengths! is split into two beams that travel different distances in the device. Because of the difference in path length (x), there is a phase difference between the two beams.

Paper Details

Date Published: 1 July 2001
PDF: 3 pages
Opt. Eng. 40(7) doi: 10.1117/1.1385336
Published in: Optical Engineering Volume 40, Issue 7
Show Author Affiliations
W. Todd Hurt, Raytheon Co. (United States)

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