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Optical Engineering

Spectral effects of sampling a continuous-scan Fourier transform spectrometer with a capacitive transimpedance amplifier (CTIA)
Author(s): W. Todd Hurt
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Paper Details

Date Published: 1 July 2001
PDF: 3 pages
Opt. Eng. 40(7) doi: 10.1117/1.1385336
Published in: Optical Engineering Volume 40, Issue 7
Show Author Affiliations
W. Todd Hurt, Raytheon Co. (United States)

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