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Optical Engineering

Measurements of laser diode astigmatism using the beam-line method
Author(s): Yakov S. Sidorin; Roland V. Shack
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Paper Abstract

We propose a novel method to measure the astigmatism of laser diodes that is based solely on power measurements and does not require the use of any imaging system. Experimental realization of this method resulted in a sensitive measuring technique. Using it, a linear dependence of astigmatism change on drive current is demonstrated for commercial index-guided laser structures. The proposed method is believed to be highly adaptable to any experimental environment. Its advantages over currently employed methods are discussed.

Paper Details

Date Published: 1 June 2001
PDF: 6 pages
Opt. Eng. 40(6) doi: 10.1117/1.1369596
Published in: Optical Engineering Volume 40, Issue 6
Show Author Affiliations
Yakov S. Sidorin, Agilent Technologies, Inc. (United States)
Roland V. Shack, Optical Sciences Ctr./Univ. of Arizona (United States)


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