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Optical Engineering

Measurements of laser diode astigmatism using the beam-line method
Author(s): Yakov S. Sidorin; Roland V. Shack
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Paper Details

Date Published: 1 June 2001
PDF: 6 pages
Opt. Eng. 40(6) doi: 10.1117/1.1369596
Published in: Optical Engineering Volume 40, Issue 6
Show Author Affiliations
Yakov S. Sidorin, Agilent Technologies, Inc. (United States)
Roland V. Shack, Optical Sciences Ctr./Univ. of Arizona (United States)

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