Share Email Print
cover

Optical Engineering

Influence of a general small inclination on the measurement in Talbot interferometry
Author(s): Qian Liu; Ryoji Ohba
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 May 2001
PDF: 7 pages
Opt. Eng. 40(5) doi: 10.1117/1.1361105
Published in: Optical Engineering Volume 40, Issue 5
Show Author Affiliations
Qian Liu, Hokkaido Univ. (Japan)
Ryoji Ohba, Hokkaido Univ. (Japan)


© SPIE. Terms of Use
Back to Top