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Journal of Electronic Imaging

Ranked data analysis of a gamut-mapping experiment
Author(s): Brian A. Millen; John Bunge; John C. Handley
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Paper Details

Date Published: 1 April 2001
PDF: 10 pages
J. Electron. Imaging. 10(2) doi: 10.1117/1.1350560
Published in: Journal of Electronic Imaging Volume 10, Issue 2
Show Author Affiliations
Brian A. Millen, Ohio State Univ. (United States)
John Bunge, Cornell Univ. (United States)
John C. Handley, Xerox Corp. (United States)

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