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Optical Engineering

Measuring the illumination angle of a flatbed scanner
Author(s): Tuck Wah Ng; Armita Tajuddin
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Paper Details

Date Published: 1 March 2001
PDF: 3 pages
Opt. Eng. 40(3) doi: 10.1117/1.1347030
Published in: Optical Engineering Volume 40, Issue 3
Show Author Affiliations
Tuck Wah Ng, National Univ. of Singapore (Singapore)
Armita Tajuddin, Micron Semiconductor Asia Pte Ltd. (Singapore)


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