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Journal of Electronic Imaging • Open Access

Special Section on Machine Vision for Industrial Inspection

Paper Abstract

In this special section we have the opportunity to explore the science and technology of image processing and scene analysis as applied to the field of machine vision. Machine vision can be described as the integration of sensors and optics, computers, algorithms, and robotics to automate manufacturing inspection and characterization for quality and process control.

Paper Details

Date Published: 1 January 2001
J. Electron. Imag. 10(1) doi: 10.1117/1.1337356
Published in: Journal of Electronic Imaging Volume 10, Issue 1
Show Author Affiliations
Kenneth W. Tobin, Oak Ridge National Lab. (United States)
John W. V. Miller, Univ. of Michigan (United States)

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