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Journal of Electronic Imaging

Special Section on Machine Vision for Industrial Inspection
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Paper Abstract

Special Section on Machine Vision for Industrial Inspection

Paper Details

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J. Electron. Imaging. 10(1) doi: 10.1117/1.1337356
Published in: Journal of Electronic Imaging Volume 10, Issue 1, January 2001
Show Author Affiliations
Kenneth W. Tobin, Oak Ridge National Lab. (United States)
John W. V. Miller, Univ. of Michigan (United States)


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