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Optical Engineering

Applying the eigenfaces and Fisherfaces methodology to circuit-board inspection
Author(s): Estille Whittenberger; Alejandro E. Brito; Sergio D. Cabrera
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Paper Details

Date Published: 1 December 2000
PDF: 11 pages
Opt. Eng. 39(12) doi: 10.1117/1.1327840
Published in: Optical Engineering Volume 39, Issue 12
Show Author Affiliations
Estille Whittenberger
Alejandro E. Brito, Univ. of Texas/El Paso (United States)
Sergio D. Cabrera, Univ. of Texas/El Paso (United States)

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