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Journal of Electronic Imaging

Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors
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Paper Details

Date Published: 1 January 2001
PDF: 6 pages
J. Electron. Imaging. 10(1) doi: 10.1117/1.1318908
Published in: Journal of Electronic Imaging Volume 10, Issue 1
Show Author Affiliations
Sven Krueger, Humboldt Univ. zu Berlin (Germany)
Guenther K.G. Wernicke, Humboldt Univ. zu Berlin (Germany)
Wolfgang Osten, Bremen Institut fuer Angewandte Strahltechnik (Germany)
Daniel Kayser, Bremer Institut fuer Angewandte Strahltechnik (Germany)
Nazif Demoli, Univ. of Zagreb (Croatia)
Hartmut Gruber, Humboldt Univ. zu Berlin (Germany)


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