Share Email Print

Journal of Electronic Imaging

Study of the imaging conditions and processing for the aspect control of specular surfaces
Author(s): Gaetan Delcroix; Ralph Seulin; Bernard Lamalle; Patrick Gorria; Fred Merienne
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

A vision system capable of imaging and detecting defects on reflective nonplanar surfaces in the production line at a high cadence is presented in this paper. Defects are typically dust located under the metallic layer of packaging products used in cosmetic industries. To realize this processing, structured lighting which reveals the defects in the image is proposed. Defects appear clearly in the images like a set of brilliant pixels in dark zones. The signature of the defect is then obtained. The size of this signature does not depend linearly on the size of the defect. It is a function of the observation angle. In order to realize a precise and robust process, the necessity of acquiring several images of the same defect is demonstrated. Because of the acquisition rate, it has been necessary to optimize image processing time by the means of an original laplacian filter and of high level techniques of programming. Results obtained using this detection system are finally presented.

Paper Details

Date Published: 1 January 2001
PDF: 7 pages
J. Electron. Imag. 10(1) doi: 10.1117/1.1314333
Published in: Journal of Electronic Imaging Volume 10, Issue 1
Show Author Affiliations
Gaetan Delcroix, Univ. de Bourgogne (France)
Ralph Seulin, Univ. de Bourgogne (France)
Bernard Lamalle, Univ. de Bourgogne (France)
Patrick Gorria, Univ. de Bourgogne (France)
Fred Merienne, Univ. de Bourgogne (France)

© SPIE. Terms of Use
Back to Top