Share Email Print

Optical Engineering

Wavelet transform for detection of partial fringe patterns induced by defects in nondestructive testing of holographic interferometry and electronic speckle pattern interferometry
Author(s): Xide Li
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Details

Date Published: 1 October 2000
PDF: 7 pages
Opt. Eng. 39(10) doi: 10.1117/1.1308485
Published in: Optical Engineering Volume 39, Issue 10
Show Author Affiliations
Xide Li, Univ. of Science and Technology of China (China)

© SPIE. Terms of Use
Back to Top