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Optical Engineering

Wavelet transform for detection of partial fringe patterns induced by defects in nondestructive testing of holographic interferometry and electronic speckle pattern interferometry
Author(s): Xide Li
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Paper Details

Date Published: 1 October 2000
PDF: 7 pages
Opt. Eng. 39(10) doi: 10.1117/1.1308485
Published in: Optical Engineering Volume 39, Issue 10
Show Author Affiliations
Xide Li, Univ. of Science and Technology of China (China)


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