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Optical Engineering

Curved-ray technique to measure the stress profile in tempered glass
Author(s): G. Wayne Brodland; Allan Dolovich
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Paper Details

Date Published: 1 September 2000
PDF: 5 pages
Opt. Eng. 39(9) doi: 10.1117/1.1287935
Published in: Optical Engineering Volume 39, Issue 9
Show Author Affiliations
G. Wayne Brodland, Univ. of Waterloo (Canada)
Allan Dolovich, Univ. of Saskatchewan (Canada)

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