Optical EngineeringShear-force, constant-height, and constant-intensity imaging in scanning near-field optical microscopy with s- and p-polarized incident light
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We present a numerical comparison between shear-force, constant-height, and constant-intensity images in scanning near-field optical microscopy. We demonstrate the general difference between the three imaging modes. Two types of incident light are tested, with polarization perpendicular and parallel to the mean plane of the surface. Merits and demerits of the three images are discussed.