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Optical Engineering

Shear-force, constant-height, and constant-intensity imaging in scanning near-field optical microscopy with s- and p-polarized incident light
Author(s): Mufei Xiao; Xin Chen
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Paper Abstract

We present a numerical comparison between shear-force, constant-height, and constant-intensity images in scanning near-field optical microscopy. We demonstrate the general difference between the three imaging modes. Two types of incident light are tested, with polarization perpendicular and parallel to the mean plane of the surface. Merits and demerits of the three images are discussed.

Paper Details

Date Published: 1 September 2000
PDF: 6 pages
Opt. Eng. 39(9) doi: 10.1117/1.1287324
Published in: Optical Engineering Volume 39, Issue 9
Show Author Affiliations
Mufei Xiao, Centro de Ciencias de la Materia Condensada (United States)
Xin Chen, UMIST (United Kingdom)

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