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Optical Engineering

Shear-force, constant-height, and constant-intensity imaging in scanning near-field optical microscopy with s- and p-polarized incident light
Author(s): Mufei Xiao; Xin Chen
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Paper Details

Date Published: 1 September 2000
PDF: 6 pages
Opt. Eng. 39(9) doi: 10.1117/1.1287324
Published in: Optical Engineering Volume 39, Issue 9
Show Author Affiliations
Mufei Xiao, Centro de Ciencias de la Materia Condensada (United States)
Xin Chen, UMIST (United Kingdom)

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