San Diego Convention Center
San Diego, California, United States
19 - 23 August 2018
Course (SC504)
Introduction to CCD and CMOS Imaging Sensors and Applications
Monday 20 August 2018
8:30 AM - 12:30 PM

Member Price $530.00
Non-Member Price $585.00
Student Member Price $309.00
  • Course Level:
  • Introductory
  • CEU:
  • 0.4
This course provides a review of general theory and operation for CCD and CMOS imaging technologies looking at the development and application statuses of both. Performance differences between CMOS and CCD imaging arrays are covered. Fundamental performance limits behind major sensor operations are presented in addition to image defects, shorts, device yield, popular chip foundries, chip cost; custom designed and off-the-shelf sensors. We discuss operation principles behind popular commercial and scientific CMOS pixel architectures, and various array readout schemes. We cover backside illuminated arrays for UV, EUV and x-ray applications; high QE frontside illuminated sensors; deep depletion CCDs, ultra large CMOS and CCD arrays; high speed/ low noise parallel readout sensors. We describe the photon transfer technique in measuring performance and calibrating camera and chip systems, and charge transfer mechanisms. We review correlated double sampling theory used to achieve low noise performance and conclude with a look at future research and development trends for each technology.
Learning Outcomes
  • describe operating CMOS and CCD arrays and camera systems for commercial and scientific imaging applications
  • explain how CCD and CMOS arrays are designed, fabricated, tested and calibrated
  • know how to apply test methodologies and performance standards
  • list specifications and requirements to select a sensor for your imaging application
  • recognize performance differences between CMOS and CCD technologies
  • describe how video signals are processed for optimum signal-to-noise performance
  • become familiar with current and future imaging technologies and applications
This course is for scientists, engineers, and managers involved with high performance CCD and CMOS imaging sensors and camera systems.
About the
Richard D. Crisp is currently vice president of new technology development and chief scientist for Etron America where he is engaged in developing multiaperture imaging systems and advanced DRAM architectures. Mr Crisp has designed Imaging Systems, CPUS, Memories, and miniaturized semiconductor packaging for over 40 years. He has worked for Intel, Motorola, MIPS, Rambus and Tessera where he has received over 99 patents for his work. He was a member of the ISSCC Program Committee from 1991 – 2000 serving as the Program Committee Chair in 2000, Vice Chair in 1999 and Subcomittee Chair 1997-98. He has published many peer-viewed papers in journals and conferences such as the ISSCC, IEEE JSSC, SPIE Electronic Imaging, ISMP, ICEP and IS&T including recent work published in the area of using Photon Transfer methods to quantify thermally dependent image lag in cooled scientific imaging systems. Mr. Crisp is also an avid astrophotographer with many published images including with the OSA, Smithsonian and Space Telescope Science Institute.
COURSE PRICE INCLUDES two eBooks Scientific Charge Coupled Devices (SPIE Press, 2001), and Photon Transfer (SPIE Press, 2007) by James Janesick.
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