San Diego Convention Center
San Diego, California, United States
17 - 21 August 2014
Course (SC1143)
Component-Level Calibration: Sources, Detectors, and Measurement Hardware
Monday 18 August 2014
1:30 PM - 5:30 PM

Course Canceled
  • Course Level:
  • Introductory
  • CEU:
  • 0.35
While the calibration of advanced systems often features prominently in the optical spotlight, the calibration of components that go into these systems is no less important. In addition, some applications require only the use of a calibrated detector or source to meet measurement goals. This course will aid the component designer, systems designer, systems integrator, and other related professionals in understanding and filling the need for component-level calibration. It will survey source and detector calibration methods, address spectral calibration for instruments providing wavelength separation, survey test equipment calibration, and provide information enabling practitioners to perform a calibration uncertainty analysis at the component level.
Learning Outcomes
  • determine whether or not your application requires a component-level calibration
  • determine whether your calibration is radiometric or photometric
  • differentiate between near and extended source calibration
  • summarize calibration methods for sources including LEDs and quartz halogen lamps, and detectors such as silicon and InGaAs photodiodes
  • describe the basics of spectral calibration
  • describe calibrations of measurement hardware including power meters and integrating sphere sphere/spectroradiometer systems
  • quantify the uncertainties in your calibration procedure
Component-level designers, integrators, systems engineers, and other professionals who need to assess component calibrations and their uncertainties. Basic familiarity with radiometric terminology and units according to the SI system is assumed, with SPIE SC1073 (Radiometry and its Practical Applications) or SC915 (Radiometry Revealed) strongly recommended.
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