San Diego Convention Center
San Diego, California, United States
12 - 16 August 2012
Conference 8495
Reflection, Scattering, and Diffraction from Surfaces III
Monday - Thursday 13 - 16 August 2012
Important
Dates
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Abstract Due:
30 January 2012

Author Notification:
9 April 2012

Manuscript Due Date:
18 July 2012

Conference
Committee
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Monday 13 August Show All Abstracts
Session PMon:
Poster Session
Monday 13 August 2012
5:30 PM - 7:30 PM
Location: Conv. Ctr. Exhibition Hall B2

Conference attendees are invited to attend the poster session on Monday evening. Come view the posters, enjoy light refreshments, ask questions, and network with colleagues in your field. Authors of poster papers will be present to answer questions concerning their papers. Attendees are required to wear their conference registration badges to the poster sessions. Poster authors, view poster presentation guidelines at http://spie.org/x30293.xml.
Roughness evaluation of very smooth surfaces using a novel method of scatter measurement
Paper 8495-38
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Thin metal film thickness detection method based on surface plasmon resonance effect
(Canceled)
Paper 8495-39
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Reflectance variability of surface coatings reveals characteristic eigenvalue spectra
Paper 8495-40
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Self focusing transmittances
Paper 8495-41
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Structural features of the diffraction field
Paper 8495-42
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Homogeneity measurements of hardness standards with a nondestructive optical method
Paper 8495-44
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A fast and accurate surface plasmon resonance system
Paper 8495-45
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Electromagnetic scattering in the open elliptic quantum billiard
Paper 8495-46
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Calibration of a reflection deflectometry system: Software Configurable Optical Testing System (SCOTS) for measuring precision aspheric optics I
Paper 8495-43
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Calibration for GMT software configurable optical testing system
Paper 8495-7
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High dynamic range and polarization imaging for on-machine fringe projection metrology
Paper 8495-25
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Tuesday 14 August Show All Abstracts
Session 1:
Scattering Theory I
Tuesday 14 August 2012
8:30 AM - 10:00 AM
Domain of validity of the equation for total integrated scatter (TIS) (Invited Paper)
Paper 8495-1
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Upper roughness limitations on the TIS/RMS relationship
Paper 8495-2
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Comparison of the domain of validity of several approximate surface scatter theories
Paper 8495-3
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Converting surface roughness data into PSD and BSDF
Paper 8495-4
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Session 2:
Imaging Methods and Applications I
Tuesday 14 August 2012
10:30 AM - 11:30 AM
Design of combined microscopical and scatterometrical imaging device of surface inspection
Paper 8495-5
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Backscatter based projectile trajectory measurement under daylight conditions
Paper 8495-6
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Surface characterization using combined analysis of original and scatter image
Paper 8495-8
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Session 3:
Optical Properties: Theory and Measurement
Tuesday 14 August 2012
1:20 PM - 3:30 PM
Inter-laboratory comparison using integrating sphere spectrophotometers to measure reflectance and transmittance of specular, diffuse, and light-redirecting glazing products (Invited Paper)
Paper 8495-9
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Comparison of NRC goniometric and integrating sphere methods for realizing an absolute diffuse reflectance scale
Paper 8495-10
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Establishing infrared reflectance standards with micro-manufactured surfaces
Paper 8495-11
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Effective medium analysis on the optical properties of silicon nanowire arrays
Paper 8495-12
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Temperature-dependent emissivity model using DC-resistance and reflectance measurements
Paper 8495-13
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Coherent backscattering cone from superdiffusive media
Paper 8495-14
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Optical Engineering Plenary Session
Tuesday 14 August 2012
4:00 PM - 5:35 PM

Session Chairs: Jose Sasian, College of Optical Sciences, The Univ. of Arizona (USA); R. John Koshel, Photon Engineering LLC (USA) and College of Optical Sciences, The Univ. of Arizona (USA)

4:00 pm: Welcome and Opening Remarks

4:05 pm: A New Job for Telescopes: Making Solar Electricity, J. Roger P. Angel, Steward Observatory Mirror Lab., The Univ. of Arizona College of Optical Sciences (USA) and REhnu LLC (USA)

4:50 pm: From Titanic to the Tiny: Three Decades of Underwater Optical Imaging, Jules S. Jaffe, Scripps Institution of Oceanography (USA)
Panel Discussion: Methods and Applications of Deflectometry
Tuesday 14 August 2012
8:00 PM - 10:00 PM
Location: Marriott Hotel, Oceanside

Moderators:
Peng Su, College of Optical Sciences, The Univ. of Arizona (United States)
Jan Burke, Bremer Institut für angewandte Strahltechnik (Germany)

Panelists:
Christian Faber, Univ. Erlangen-Nuremberg (Germany)
Robert E. Parks, College of Optical Sciences, The Univ. of Arizona (United States)
FURTHER PANELISTS TO BE CONFIRMED

Large or very large optical components, aspherics, and freeform optics have proven very difficult and expensive to measure with interferometry. As the interest and market for such components continues to grow, the need has become apparent to complement (and sometimes even replace) interferometry with a technique that is more versatile and less sensitive to misalignments. Simply and inexpensively measuring the distortion of a reflected fringe pattern (e.g. from a computer screen), a technique known as deflectometry, is capable of stunning sensitivity, since it is a gradient technique - however the calculation of the absolute shape is an unsolved problem. The question is, how urgently do we need the absolute shape? Could the slope data be sufficient? Also, there are numerous applications besides precision optics where deflectometry excels by its versatility - portable systems could be realized with as little as a laptop with web cam, or even a smartphone, and still function as serious measurement equipment.

We invite anyone working in deflectometry to come along, share their latest research and applications with a brief presentation, and point out the problems yet to solve. Interferometrists looking for solutions (or picking on the weaknesses of deflectometry) are also invited. We are hoping to get an idea of where we are, where the gaps and show-stoppers are, and come up with a roadmap for technical development and industrial implementation.
Wednesday 15 August Show All Abstracts
Session 4:
Scattering Theory II
Wednesday 15 August 2012
8:40 AM - 10:30 AM
Estimating hemispherical scatter from incident plane measurements of isotropic samples (Invited Paper)
Paper 8495-15
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A BRDF model for scratches and digs
Paper 8495-16
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Surface-plasmon mediated near-field light diffraction
Paper 8495-17
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How accurate is the Kubelka-Munk theory of diffuse reflection? A quantitative answer
Paper 8495-18
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Coherence model for laser and solar scattering from diffuse metals
Paper 8495-19
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Session 5:
Measurement Instrumentation and Applications I
Wednesday 15 August 2012
11:00 AM - 12:20 PM
Tunable supercontinuum fiber laser source for BRDF measurements in the STARR II gonioreflectometer
Paper 8495-20
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Quantification of the systematic and random measurement uncertainty of a polarimetric scatterometry system designed for enhanced e-field device characterization
Paper 8495-21
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Scatterometer basing on a STAR GEM idea for optical measurements of microlenses
Paper 8495-22
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The Southwest Research Institute ultraviolet reflectance chamber (SwURC): a far ultraviolet reflectometer
Paper 8495-23
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Session 6:
Imaging Methods and Applications II
Wednesday 15 August 2012
2:20 PM - 3:30 PM
The focusing of light scattered from diffuse reflectors using phase modulation (Invited Paper)
Paper 8495-24
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Scattering computation for 3D laser imagery and reconstruction algorithms (Invited Paper)
Paper 8495-26
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Matrix determination of hidden object reflectance by indirect photography
Paper 8495-27
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Session 7:
Measurement Instrumentation and Applications II
Wednesday 15 August 2012
4:00 PM - 5:00 PM
Measuring grazing-angle DHR with the infrared grazing angle reflectometer
Paper 8495-28
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Extension of the NIST infrared reference integrating sphere system to 28 um
Paper 8495-29
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Advanced gloss sensing for robotic applications
Paper 8495-30
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Emittance of refractory materials for high temperature industrial furnaces
Paper 8495-47
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Thursday 16 August Show All Abstracts
Session 8:
Measurement and Analysis Techniques
Thursday 16 August 2012
8:50 AM - 10:20 AM
Sophisticated light scattering techniques from the VUV to the IR regions (Invited Paper)
Paper 8495-31
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Effects of a measurement floor on Mueller matrix measurements in a DRR BSDF system
Paper 8495-32
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Using differential ray tracing in stray light analysis
Paper 8495-33
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Optical non-contact micrometer thickness measurement system for silica thick films
Paper 8495-34
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Session 9:
Measurement Instrumentation and Applications III
Thursday 16 August 2012
10:50 AM - 12:00 PM
Extensive goniometric spectral measurements at desert sites for military engineering (Invited Paper)
Paper 8495-35
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Optimized diffusers for reflective mirasol displays: experience from metrology characterization
Paper 8495-36
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Optical sensor for ice detection in harsh environments
(Canceled)
Paper 8495-37
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