San Diego Convention Center
San Diego, California, United States
19 - 23 August 2018
Course (SC916)
Digital Camera and Sensor Evaluation Using Photon Transfer
Monday 20 August 2018
1:30 PM - 5:30 PM

FormatCourse
Course Canceled
Course
Details
  • Course Level:
  • Introductory
  • CEU:
  • 0.4
Course
Summary
Photon transfer (PT) is a popular and essential empirical characterization method employed in the design, operation, characterization, calibration, optimization, specification and application of digital scientific and commercial camera systems. The PT user-friendly technique is based on only two measurements- average signal and rms noise which together produce a multitude of important graphical data products useful for evaluating digital camera systems (most notably CCD and CMOS). PT is applicable to all imaging disciplines. Design and fabrication process engineers developing imagers rely heavily on PT data products in determining discrete performance parameters such as quantum efficiency (QE), quantum yield, read noise, full well, dynamic range, nonlinearity, fixed pattern noise, V/e- conversion gain, dark signal, image, etc. Camera users routinely use the PT technique to determine system level performance parameters to convert relative measurements into absolute electron and photon units, offset correction, flat field and image S/N, ADC quantizing noise, optimum encoding, minimum detectable luminance, operating temperature to remove dark noise , reliability, stability, etc. PT is also the first go/no-go test performed to determine the health of new camera system and/or detector as well as provide a tool for troubleshooting problems. This course will review these aspects and many others offered by PT.
Learning Outcomes
  • develop reproducible methods to measure empirical camera or CCD/CMOS imager performance using graphical PT methods to permit objective comparison of camera/sensor alternatives
  • describe and create PT products by manipulating the Noise Equation
  • calibrate a camera system in both relative and absolute physical units
  • assess camera/sensor performance over the full dynamic range to ensure proper operation
  • use PT to quantify optimum removal of fixed pattern noise in images to attain the highest S/N possible through flat fielding
  • develop intuitive understanding of signal-to-noise image theory & optimization through PT
  • discuss practical methods for taking empirical data for the novice and advanced user for generating PT, Modulation and Lux Transfer curves
Intended
Audience
Engineers, scientists, and technical managers working with commercial and scientific digital camera systems. SC504 Introduction to CCD and CMOS Imaging Sensors and Applications is a pre-requisite for the course.
About the
Instructor
Richard D. Crisp is currently vice president of new technology development and chief scientist for Etron America where he is engaged in developing multiaperture imaging systems and advanced DRAM architectures. Mr Crisp has designed Imaging Systems, CPUS, Memories, and miniaturized semiconductor packaging for over 40 years. He has worked for Intel, Motorola, MIPS, Rambus and Tessera where he has received over 99 patents for his work. He was a member of the ISSCC Program Committee from 1991 – 2000 serving as the Program Committee Chair in 2000, Vice Chair in 1999 and Subcomittee Chair 1997-98. He has published many peer-viewed papers in journals and conferences such as the ISSCC, IEEE JSSC, SPIE Electronic Imaging, ISMP, ICEP and IS&T including recent work published in the area of using Photon Transfer methods to quantify thermally dependent image lag in cooled scientific imaging systems. Mr. Crisp is also an avid astrophotographer with many published images including with the OSA, Smithsonian and Space Telescope Science Institute.
Additional
Notes
COURSE PRICE INCLUDES the eBook Photon Transfer (SPIE Press, 2007) by James R. Janesick.
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