Internationales Congress Center
Munich, Germany
25 - 29 June 2017
Conference 10329
Optical Measurement Systems for Industrial Inspection X
Monday - Thursday 26 - 29 June 2017
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Monday 26 June Show All Abstracts
Welcome and Introduction
Monday 26 June 2017
8:25 AM - 8:30 AM
Session 1:
Interometric Techniques I
Monday 26 June 2017
8:30 AM - 10:00 AM
Session Chairs:
Wolfgang Osten, Institut für Technische Optik (Germany) ;
Peter Lehmann, Univ. Kassel (Germany)
Optical metrology in industry: exciting times and some history (Invited Paper)
Paper 10329-1
Time: 8:30 AM - 9:00 AM
Author(s): John H. Bruning, Corning Tropel Corp. (United States)
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Polarization and phase shifting interferometry
Paper 10329-2
Time: 9:00 AM - 9:20 AM
Author(s): Sergej Rothau, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany); Klaus Mantel, Max-Planck-Institut für die Physik des Lichts (Germany); Norbert Lindlein, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
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Increasing the accuracy of tilted-wave-interferometry by elimination of systematic errors
Paper 10329-3
Time: 9:20 AM - 9:40 AM
Author(s): Johannes Schindler, Univ. Stuttgart (Germany); Christof Pruss, Wolfgang Osten, Institut für Technische Optik (Germany)
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Full-field heterodyne dynamic interferometry based on hertz-level low differential-frequency acousto-optic frequency shifter
Paper 10329-4
Time: 9:40 AM - 10:00 AM
Author(s): Zhou Wu, Academy of Opto-Electronics, CAS (China), Univ. of Chinese Academy of Sciences (China); Wenxi Zhang, Bin Xiangli, Xinxin Kong, Academy of Opto-Electronics (China)
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Session PLS:
World of Photonics Congress-wide Plenary Session
Monday 26 June 2017
10:00 AM - 11:00 AM
Putting a spin on photons (Plenary Presentation)
Paper 10329-500
Time: 10:00 AM - 11:00 AM
Author(s): S. Burk, H. Fedder, J. Wrachtrup, Univ. Stuttgart (Germany)
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Coffee Break 11:00 AM - 11:15 AM
Session 2:
Interometric Techniques II
Monday 26 June 2017
11:20 AM - 12:40 PM
Session Chair:
Pascal Picart, Univ. du Maine (France)
Phase imaging using a single-pixel camera
Paper 10329-5
Time: 11:20 AM - 11:40 AM
Author(s): Yoshio Hayasaki, Kazuki Ota, Utsunomiya Univ. (Japan)
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Applications of digital interferometer
Paper 10329-6
Time: 11:40 AM - 12:00 PM
Author(s): Sen Han, Univ. of Shanghai for Science and Technology (China)
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Spatial-temporal phase shifting interferometry: suppressing phase errors in dynamic Fizeau interferometer
Paper 10329-7
Time: 12:00 PM - 12:20 PM
Author(s): Wenhua Zhu, Lei Chen, Rihong Zhu, Rui Zhang, Donghui Zheng, Nanjing Univ. of Science and Technology (China)
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Study on measurement accuracy of active optics null test systems based on liquid crystal spatial light modulator and laser interferometer
Paper 10329-8
Time: 12:20 PM - 12:40 PM
Author(s): Shijie Liu, Shanghai Institute of Optics and Fine Mechanics (China); Longbo Xu, Nanjing Univ. of Science and Technology (China); Xiao Ma, Zhigang Zhang, You Zhou, Qi Lu, Shanghai Institute of Optics and Fine Mechanics (China); Yunbo Bai, Shaqnghai Institute of Optics and Fine Mechanics (China); Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China)
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Lunch Break 12:40 PM - 2:00 PM
Session 3:
Digital Holography and Holographic Microscopy
Monday 26 June 2017
2:00 PM - 4:00 PM
Session Chair:
Pietro Ferraro, Istituto di Scienze applicata e Sistemi Intelligenti (Italy)
Evaluation of refocus criteria for holographic particle imaging
Paper 10329-9
Time: 2:00 PM - 2:20 PM
Author(s): Pascal Picart, Univ. du Maine (France); Soumaya Kara-Mohammed, Larbi L. Bouamama, Derradji Bahloul, Univ. Ferhat Abbas de Sétif (Algeria)
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Topography measurements of high NA aspherical microlenses by digital holographic microscopy with spherical illumination
Paper 10329-10
Time: 2:20 PM - 2:40 PM
Author(s): Michal Józwik, Warsaw Univ. of Technology (Poland); Marta Mikuła, Warsaw Univ of Technology (Poland); Tomasz Kozacki, Julianna Kostencka, Warsaw Univ. of Technology (Poland); Christophe Gorecki, FEMTO-ST (France)
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Digital holography on moving objects: multiwavelength height measurements on inclined surfaces
Paper 10329-11
Time: 2:40 PM - 3:00 PM
Author(s): Annelie Schiller, Tobias Beckmann, Markus Fratz, Dominik Belzer, Alexander Bertz, Daniel Carl, Fraunhofer-Institut für Physikalische Messtechnik (Germany); Karsten Buse, Fraunhofer-Institut für Physikalische Messtechnik (Germany), Univ. of Freiburg (Germany)
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A method for total noise removal in digital holography based on enhanced grouping and sparsity enhancement filtering
Paper 10329-13
Time: 3:00 PM - 3:20 PM
Author(s): Vittorio Bianco, Pasquale Memmolo, Melania Paturzo, Andrea Finizio, Pietro Ferraro, Istituto di Scienze applicata e Sistemi Intelligenti (Italy)
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Miniaturized multiwavelength digital holography sensor for extensive in-machine tool measurement
Paper 10329-14
Time: 3:20 PM - 3:40 PM
Author(s): Tobias Seyler, Markus Fratz, Tobias Beckmann, Alexander Bertz, Daniel Carl, Fraunhofer-Institut für Physikalische Messtechnik (Germany)
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High-throughput single-shot hyperspectral interferometer for areal profilometry based on microlens array integral field unit
Paper 10329-179
Time: 3:40 PM - 4:00 PM
Author(s): Pablo D. Ruiz, Jonathan M. Huntley, Loughborough Univ. (United Kingdom)
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Coffee Break 4:00 PM - 4:30 PM
Session 4:
OCT and Coherence Scanning
Monday 26 June 2017
4:30 PM - 6:10 PM
Session Chair:
Christian Rembe, Technische Univ. Clausthal (Germany)
Tomographical process monitoring of laser transmission welding with OCT
Paper 10329-15
Time: 4:30 PM - 4:50 PM
Author(s): Philippe Ackermann, Fraunhofer-Institut für Produktionstechnologie IPT (Germany); Robert H. Schmitt, RWTH Aachen Univ. (Germany)
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Non-destructive testing of layer-to-layer fusion of a 3D print using ultrahigh resolution optical coherence tomography
Paper 10329-16
Time: 4:50 PM - 5:10 PM
Author(s): Niels M. Israelsen, Technical Univ. of Denmark (Denmark); Michael Maria, Univ. of Kent (United Kingdom), NKT Photonics Inc. (Denmark); Thomas Feuchter, NKT Photonics A/S (Denmark); Adrian Podoleanu, Univ. of Kent (United Kingdom); Ole Bang, DTU Fotonik (Denmark)
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Applications of optical coherence tomography in the non-contact assessment of automotive paints
Paper 10329-17
Time: 5:10 PM - 5:30 PM
Author(s): Samuel J. Lawman, Jinke Zhang, Bryan M. Williams, Yalin Zheng, Yao-Chun Shen, Univ. of Liverpool (United Kingdom)
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Single-shot multilayer measurement by chromatic confocal coherence tomography
Paper 10329-18
Time: 5:30 PM - 5:50 PM
Author(s): Tobias Boettcher, Marc Gronle, Wolfgang Osten, Institut für Technische Optik (Germany)
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Tolerance on sphere radius for the calibration of the transfer function of coherence scanning interferometry
Paper 10329-19
Time: 5:50 PM - 6:10 PM
Author(s): Rong Su, The Univ. of Nottingham (United Kingdom); Jeremy M. Coupland, Loughborough Univ. (United Kingdom); Yuhang Wang, Harbin Institute of Technology (China); Richard K. Leach, The Univ. of Nottingham (United Kingdom)
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Tuesday 27 June Show All Abstracts
Session 5:
High-Speed Techniques
Tuesday 27 June 2017
8:30 AM - 10:00 AM
Session Chair:
Ralf B. Bergmann, Bremer Institut für angewandte Strahltechnik GmbH (Germany)
New challenges for optical inspection in the times of industry 4.0 (Invited Paper)
Paper 10329-20
Time: 8:30 AM - 9:00 AM
Author(s): Robert H. Schmitt, RWTH Aachen Univ. (Germany); Reik Krappig, Fraunhofer-Institut für Produktionstechnologie IPT (Germany)
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GOBO projection for underwater 3D measurement technique
Paper 10329-21
Time: 9:00 AM - 9:20 AM
Author(s): Peter Kühmstedt, Christian Bräuer-Burchardt, Stefan Heist, Ingo Schmidt, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany); Gunther Notni, Technical Univ. Ilmenau (Germany), Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
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Verification of real sensor motion for a high-dynamic 3D measurement inspection system
Paper 10329-22
Time: 9:20 AM - 9:40 AM
Author(s): Andreas Breitbarth, Martin Correns, Technische Univ. Ilmenau (Germany); Manuel Zimmermann, GÖPEL electronic GmbH (Germany); Chen Zhang, Maik Rosenberger, Technische Univ. Ilmenau (Germany); Jörg Schambach, GÖPEL electronic GmbH (Germany); Gunther Notni, Technische Univ. Ilmenau (Germany)
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High speed imaging for assessment of impact damage in natural fibre biocomposites
Paper 10329-23
Time: 9:40 AM - 10:00 AM
Author(s): Karthik Ram Ramakrishnan, Stephane Corn, Nicolas Le Moigne, Patrick Ienny, Romain Leger, Pierre R. Slangen, Mines Alès (France)
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Coffee Break 10:00 AM - 10:30 AM
Session 6:
Fringe Projection I
Tuesday 27 June 2017
10:30 AM - 11:30 AM
Session Chair:
Jan Burke, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)
Miniaturization of an optical 3D sensor by additive manufacture of metallic mirrors
Paper 10329-24
Time: 10:30 AM - 10:50 AM
Author(s): Andre Sigel, Markus Merkel, Andreas Heinrich, Hochschule Aalen (Germany)
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Platform for 3D inline process control in additive manufacturing
Paper 10329-26
Time: 10:50 AM - 11:10 AM
Author(s): Marc Preissler, Chen Zhang, Maik Rosenberger, Gunther Notni, Technische Univ. Ilmenau (Germany)
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Flexible registration method for light-stripe sensors considering sensor misalignments
Paper 10329-27
Time: 11:10 AM - 11:30 AM
Author(s): Waldemar Gorschenew, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
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Lunch Break 11:30 AM - 12:50 PM
Session PS1:
Posters--Tuesday
Tuesday 27 June 2017
12:50 PM - 2:10 PM

Conference attendees are invited to attend the Optical Metrology Poster Session 1 on Tuesday. Come view the posters and network with colleagues in your field. Authors of poster papers will be present to answer questions concerning their papers. Attendees are required to wear their conference registration badges to the poster sessions. Posters will be available for viewing starting at 12:50 through 14:10 hrs on Thursday. Poster authors, view poster presentation guidelines and set-up instructions on page 6, and at http://spie.org/x6513.xml. (Follow the Special Events link)
Parallelism measurement of plane glass at oblique incidence by interferometry
Paper 10329-73
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
New technique for generating light source array in tilted wave interferometer
Paper 10329-74
Time: 12:50 PM - 2:10 PM
Author(s): Jia Li, Hua Shen, Rihong Zhu, Qing Lu, Nanjing Univ. of Science and Technology (China)
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Absolute test using the conjugate differential method
Paper 10329-75
Time: 12:50 PM - 2:10 PM
Author(s): Ya Huang, Jun Ma, Nanjing Univ. of Science and Technology (China); Caojin Yuan, Nanjing Normal Univ. (China); Lei Chen, Rihong Zhu, Zhishan Gao, Nanjing Univ. of Science and Technology (China)
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Optical scanner system for high resolution measurement of lubricant distributions on metal strips based on laser induced fluorescence
Paper 10329-79
Time: 12:50 PM - 2:10 PM
Author(s): Philipp Holz, Christian Lutz, Albrecht C. Brandenburg, Fraunhofer-Institut für Physikalische Messtechnik (Germany)
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Characterizing the quality of the fiber optic reference for cylindrical wave testing
Paper 10329-80
Time: 12:50 PM - 2:10 PM
Author(s): Ayshah Alatawi, Tabuk Univ. (Saudi Arabia); Patrick J. Reardon, The Univ. of Alabama in Huntsville (United States)
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Fiber Bragg grating vibration measurement device
Paper 10329-81
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
Analysis of the fractures of metallic materials using optical coherence tomography
Paper 10329-82
Time: 12:50 PM - 2:10 PM
Author(s): Gheorghe Hutiu, Aurel Vlaicu Univ. of Arad (Romania); Virgil-Florin Duma, Aurel Vlaicu Univ. of Arad (Romania), Polytechnic Univ. of Timisoara (Romania); Dorin Demian, Aurel Vlaicu Univ. of Arad (Romania); Adrian Bradu, Adrian Podoleanu, Univ. of Kent (United Kingdom)
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A novel white-light interferometry using low differential-frequency heterodyne system
Paper 10329-83
Time: 12:50 PM - 2:10 PM
Author(s): Xinxin Kong, Beihang Univ. (China), Academy of Opto-Electronics, CAS (China); Bin Xiangli, Beihang Univ. (China); Wenxi Zhang, Zhou Wu, Yang Li, Xiaoyu Lv, Academy of Opto-Electronics, CAS (China)
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Fiber Bragg gratings strain measuring system and a sensor calibration setup based on mechanical nanomotion transducer
Paper 10329-84
Time: 12:50 PM - 2:10 PM
Author(s): Vladimir A. Lazarev, Stanislav O. Leonov, Mikhail K. Tarabrin, Valerii E. Karasik,, Bauman Moscow State Technical Univ. (Russian Federation)
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Evaluation and tolerancing of irregularly shaped interferometric test regions
Paper 10329-85
Time: 12:50 PM - 2:10 PM
Author(s): Christian Beder, Carl Zeiss Meditec AG (Germany); Martin Peschka, Carl Zeiss AG (Germany)
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Remote sensing of atmospheric turbulence profiles by laser guide stars
Paper 10329-86
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
Laser-line scanning speckle reduction based on a one-dimensional beam homogenizer
Paper 10329-87
Time: 12:50 PM - 2:10 PM
Author(s): Bryan L. Nelsen, Paul Jacobs, Westsächsische Hochschule Zwickau (Germany); Peter Hartmann, Westsächsische Hochschule Zwickau (Germany), Fraunhofer-Institut für Werkstoff- und Strahltechnik (Germany)
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High-power LED light sources for optical measurement systems operated in continuous and overdriven pulsed modes
Paper 10329-88
Time: 12:50 PM - 2:10 PM
Author(s): Boleslaw Stasicki, Andreas Schröder, Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany); Fritz Boden, Deutsches Zentrum für Luft- und Raumfahrt e.V. (DLR) (Germany); Krzysztof Ludwikowski, HARDsoft Microprocessor Systems (Poland)
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The research of structured reflective surface of matrix sensor according to generalized scheme of ellipsometry
Paper 10329-89
Time: 12:50 PM - 2:10 PM
Author(s): Anastasiya Y. Lobanova, Anastasia A. Blokhina, Victoria A. Ryzhova, Valery V. Korotaev, Victor M. Denisov, ITMO Univ. (Russian Federation)
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A metrological comparison of Raman-distributed temperature sensors
Paper 10329-90
Time: 12:50 PM - 2:10 PM
Author(s): Guillaume Failleau, Olivier Beaumont, Refat Razouk, Lab. National de Metrologie et d'Essais (France); Sylvie Delepine-Lesoille, ANDRA (France); François Martinot, EDF - DTG Grenoble (France); Johan Bertrand, ANDRA (France); Bruno Hay, Lab. National de Metrologie et d'Essais (France)
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Phase A: calibration concepts for HIRES
Paper 10329-91
Time: 12:50 PM - 2:10 PM
Author(s): Philipp Huke, Georg-August-Univ. Göttingen (Germany); Livia Origlia, INAF - Osservatorio Astronomico di Bologna (Italy); Marco Riva, Observatoire de Genève (Switzerland); Jake M. Charsley, Richard A. McCracken, Derryck T. Reid, Heriot-Watt Univ. (United Kingdom); Grzegorz Kowzan, Piotr Maslowski, Nicolaus Copernicus Univ. (Poland); Karen Disseau, Sebastian Schäfer, Georg-August-Univ. Göttingen (Germany); Christopher Broeg, Mirsad Sarajlic, Univ. Bern (Switzerland); François Dolon, Observatoire de Haute-Provence (France); Heidi Korhonen, Dark Cosmology Ctr. (Denmark); Ansgar Reiners, Georg-August-Univ. Göttingen (Germany); Isabelle Boisse, Lab. d'Astrophysique de Marseille (France); Sandrine Perruchot, Observatoire de Haute-Provence (France); Sebastien Ottogalli, Lab. J.L. Lagrange (France); Francesco Pepe, Observatoire de Genève (Switzerland); Ernesto Oliva, INAF - Osservatorio Astrofisico di Arcetri (Italy)
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Femtosecond Z-scan measurements of the nonlinear refractive index of fused silica
Paper 10329-92
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
Neural network and optical fiber sensor as intelligent heart rate monitor
Paper 10329-93
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
Development of hydrogen sensors based on fiber Bragg grating with a palladium foil for online dissolved gas analysis in transformers
Paper 10329-94
Time: 12:50 PM - 2:10 PM
Author(s): Maximilian Fisser, Rodney A. Badcock, Robinson Research Institute (New Zealand); Paul D. Teal, Victoria Univ. of Wellington (New Zealand); Adam J. Swanson, Callaghan Innovation (New Zealand); Arvid Hunze, Robinson Research Institute (New Zealand)
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Development of a low-cost, 11 µm spectral domain optical coherence tomography surface profilometry prototype
Paper 10329-95
Time: 12:50 PM - 2:10 PM
Author(s): Nyasha J. Suliali, Peter Baricholo, National Univ. of Science and Technology (Zimbabwe); Pieter H. Neethling, Erich G. Rohwer, Stellenbosch Univ. (South Africa)
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Gas monitoring onboard ISS using FTIR spectroscopy
Paper 10329-96
Time: 12:50 PM - 2:10 PM
Author(s): Michael Gisi, Armin Stettner, Roland Seurig, OHB-System AG (Germany); Atle Honne, SINTEF (Norway); Johannes Witt, Pierre Rebeyre, European Space Research and Technology Ctr. (Netherlands)
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Experimental light scattering by small particles: system design and calibration
Paper 10329-97
Time: 12:50 PM - 2:10 PM
Author(s): Göran Maconi, Ivan Kassamakov, Antti Penttilä, Maria Gritsevich, Edward Hæggström, Karri Muinonen, Univ. of Helsinki (Finland)
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Light section measurement to quantify the accuracy loss induced by laser light deflection in an inhomogeneous refractive index field
Paper 10329-98
Time: 12:50 PM - 2:10 PM
Author(s): Rüdiger Beermann, Lorenz Quentin, Andreas Pösch, Eduard Reithmeier, Markus Kästner, Leibniz Univ. Hannover (Germany)
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Digital holographic inspection for drying processes of paint films and ink dots
Paper 10329-99
Time: 12:50 PM - 2:10 PM
Author(s): Masayuki Yokota, Fumiya Aoyama, Shimane Univ. (Japan)
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Development of optical-electronic autocollimation sensor for industrial inspection with an increased measurement range
Paper 10329-100
Time: 12:50 PM - 2:10 PM
Author(s): Aiganym Sakhariyanova, Igor A. Konyakhin, Renpu Li, ITMO Univ. (Russian Federation)
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Influence of the limited detector size on spatial variations of the reconstruction accuracy in holographic tomography
Paper 10329-102
Time: 12:50 PM - 2:10 PM
Author(s): Julianna Kostencka, Tomasz Kozacki, Warsaw Univ. of Technology (Poland); Bryan Hennelly, Department of Electronic Engineering, National University of Ireland (Ireland), Department of Computer Science, National University of Ireland (Ireland); John T. Sheridan, School of Electrical, Electronic and Communication Engineering, University College Dublin (Ireland)
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High-precision surface measurement of long-radius concave sphere with diverging transmission
Paper 10329-103
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
New method for probe position correction for Ptychography
Paper 10329-104
Time: 12:50 PM - 2:10 PM
Author(s): Priya Dwivedi, Sander Konijnenberg, Silvania Pereira, Hendrik P. Urbach, Technische Univ. Delft (Netherlands)
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Holographic prism based on photo-thermo-refractive glass
Paper 10329-105
Time: 12:50 PM - 2:10 PM
Author(s): Sergei Ivanov, Alexsandr Angervaks, Doan Van Bac, Nikolay Nikonorov, Roman Okun', ITMO Univ. (Russian Federation)
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Component-level test of molded freeform optics for LED beam shaping using experimental ray tracing
Paper 10329-106
Time: 12:50 PM - 2:10 PM
Author(s): Gustavo Gutierrez, Hochschule Bremen (Germany); David Hilbig, Friedrich Fleischmann, Thomas Henning, Hochschule Bremen Univ. of Applied Sciences (Germany)
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Characterization of edge effects in precision low-coherence interferometry using broadband light sources
Paper 10329-108
Time: 12:50 PM - 2:10 PM
Author(s): Christopher Taudt, Westsächsische Hochschule Zwickau (Germany); Tobias Baselt, Westsachsische Hochschule Zwickau (Germany); Bryan L. Nelsen, Westsächsische Hochschule Zwickau (Germany); Heiko Assmann, Infineon Dresden GmbH (Germany); Andreas Greiner, Infineon Technologies Dresden (Germany); Edmund Koch, Technische Univ. Dresden (Germany); Peter Hartmann, Westsachsische Hochschule Zwickau (Germany)
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In-line height profiling metrology sensor for zero defect production control
Paper 10329-109
Time: 12:50 PM - 2:10 PM
Author(s): Rob Snel, Jasper Winters, Thomas Liebig, Wouter Jonker, TNO (Netherlands)
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Compact DPSS-laser source for LIBS analysis of steel
Paper 10329-110
Time: 12:50 PM - 2:10 PM
Author(s): Andreas Tortschanoff, Marcus Baumgart, Gerhard Kroupa, CTR Carinthian Tech Research AG (Austria)
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Defect detection in translucent materials by thermal stressing using lensless Fourier transform digital holography
Paper 10329-111
Time: 12:50 PM - 2:10 PM
Author(s): Vismay Trivedi, Swapnil Mahajan, Mugdha Joglekar, Vani K. Chhaniwal, The Maharaja Sayajirao Univ. of Baroda (India); Bahram Javidi, Univ. of Connecticut (United States); Arun Anand, The Maharaja Sayajirao Univ. of Baroda (India)
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Design and fabrication of micro silica sphere cavity force sensor based on hybrid Fabry Perot interferometer
Paper 10329-112
Time: 12:50 PM - 2:10 PM
Author(s): Omid R. Ranjbar Naeini, Forough Jafari, Pegah Zarafshani, Mohammad I. Zibaii, Hamid Latifi, Shahid Beheshti Univ. (Iran, Islamic Republic of)
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Fast searching measurement of absolute displacement based on submicron-aperture fiber point-diffraction interferometer
Paper 10329-113
Time: 12:50 PM - 2:10 PM
Author(s): Daodang Wang, Zhichao Wang, China Jiliang Univ. (China); Rongguang Liang, College of Optical Sciences, The Univ. of Arizona (United States); Ming Kong, Jun Zhao, China Jiliang Univ. (China); Jufeng Zhao, Hangzhou Dianzi Univ. (China); Linhai Mo, Volkslift (China) Company Limited, Huzhou 313009, China (China); Wei Li, China Jiliang Univ. (China)
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Autocollimation system for measuring angular deformations with reflector designed by quaternionic method
Paper 10329-114
Time: 12:50 PM - 2:10 PM
Author(s): Van Phong Hoang, Igor A. Konyakhin, ITMO Univ. (Russian Federation)
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Steps towards traceability for an asphere interferometer
Paper 10329-115
Time: 12:50 PM - 2:10 PM
Author(s): Ines Fortmeier, Manuel Stavridis, Clemens Elster, Michael Schulz, Physikalisch-Technische Bundesanstalt (Germany)
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Principles of radiation terrain mapping with SiPM gamma spectrometer
Paper 10329-117
Time: 12:50 PM - 2:10 PM
Author(s): Anna V. Trushkina, Victoria A. Ryzhova, Valery V. Korotaev, ITMO Univ. (Russian Federation); Victor M. Denisov, ITMO Univ. (Russian Federation), Flagman-geo Ltd. (Russian Federation); Andrey V. Radilov, Flagman-geo Ltd. (Russian Federation)
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The spatial concentration of dust emissions measured by using 3D scanning lidar in the open storage yards of steel-making company
Paper 10329-118
Time: 12:50 PM - 2:10 PM
Author(s): Chih-Wei Chiang, Hong-Wei Chiang, Huann-Ming Chou, Shu-Huang Sun, Kun Shan Univ. (Taiwan); Jiann-Shen Lee, China Steel Corp. (Taiwan)
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Optoelectronic joined-channel autocollimator for measuring three angular coordinates
Paper 10329-120
Time: 12:50 PM - 2:10 PM
Author(s): Anton A. Nogin, Igor A. Konyakhin, ITMO Univ. (Russian Federation)
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Interferometric signals analysis based on the extended Kalman filter tuned by machine learning technique
Paper 10329-122
Time: 12:50 PM - 2:10 PM
Author(s): Petr A. Ermolaev, Maxim A. Volynsky, ITMO Univ. (Russian Federation)
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The small-sized ultraprecision sensor for measuring linear displacements
Paper 10329-123
Time: 12:50 PM - 2:10 PM
Author(s): Dmitrii S. Lushnikov, Alexander Y. Zherdev, Sergey B. Odinokov, Vladimir V. Markin, Oleg A. Gurylev, Maria V. Shishova, Bauman Moscow State Technical Univ. (Russian Federation)
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Simulation of multispectral multisource for device of consumer and medicine products analysis
Paper 10329-125
Time: 12:50 PM - 2:10 PM
Author(s): Timofey Korolev, Vladimir S. Peretiagin, ITMO Univ. (Russian Federation)
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Online hyperspectral imaging system for evaluating quality of agricultural products
Paper 10329-126
Time: 12:50 PM - 2:10 PM
Author(s): Changyeun Mo, Giyoung Kim, Jongguk Lim, National Institute of Agricultural Sciences (Korea, Republic of)
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Enhancement of spatial resolution in digital holographic microscopy using speckle field generated from ring-slit apertures
Paper 10329-127
Time: 12:50 PM - 2:10 PM
Author(s): Hideki Funamizu, Yusei Onodera, Muroran Institute of Technology (Japan); Jun Uozumi, Hokkai-Gakuen Univ. (Japan); Yoshihisa Aizu, Muroran Institute of Technology (Japan)
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Phase and group refractive indices of air calculation by fitting of phase difference measured using a combination of laser and low-coherence interferometry
Paper 10329-128
Time: 12:50 PM - 2:10 PM
Author(s): Tomáš Pikálek, Martin Šarbort, Ondřej Cip, Minh Tuan Pham, Adam Lešundák, Lenka Pravdová, Zdeněk Buchta, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
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Very high aspect ratio through silicon via reflectometry
Paper 10329-129
Time: 12:50 PM - 2:10 PM
Author(s): Joachim Bauer, Friedhelm Heinrich, Technische Hochschule Wildau (Germany); Oksana Fursenko, Steffen Marschmeyer, IHP GmbH (Germany); Adrian Bluemich, SENTECH Instruments GmbH (Germany); Silvio Pulwer, Patrick Steglich, Claus Villringer, Technische Hochschule Wildau (Germany); Andreas Mai, IHP GmbH (Germany); Sigurd Schrader, Technische Hochschule Wildau (Germany)
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Application of identifying transmission spheres for spherical surface testing
Paper 10329-130
Time: 12:50 PM - 2:10 PM
Author(s): Christopher B. Han, Suzhou Singapore International School (China); Xin Ye, Univ. of Shanghai for Science and Technology (China), Suzhou H&L Instruments LLC (China); Xueyuan Li, Suzhou H&L Instruments LLC (China); Quanzhao Wang, Suzhou W&N Instruments LLC (China); Shouhong Tang, Univ. of Shanghai for Science and Technology (China), Suzhou H&L Intstruments LLC (China); Sen Han, Univ. of Shanghai for Science and Technology (China), Suzhou H&L Instruments LLC (China)
Show Abstract
Investigation of accuracy characteristics of circular photodetector: Multiscan
Paper 10329-131
Time: 12:50 PM - 2:10 PM
Author(s): Kirill S. Povarov, Sergey S. Mitrofanov, ITMO Univ. (Russian Federation)
Show Abstract
Optical measurement system of microcomponents flatness by Moiré interferometry
Paper 10329-132
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
High precision laser photometer for laser optics
Paper 10329-133
Time: 12:50 PM - 2:10 PM
Author(s): Yuanan Zhao, Guohang Hu, Zhen Cao, Shijie Liu, Meiping Zhu, Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China)
Show Abstract
Analysis on optical heterodyne frequency error of full-field heterodyne interferometer
Paper 10329-134
Time: 12:50 PM - 2:10 PM
Author(s): Yang Li, Wenxi Zhang, Zhou Wu, Xiaoyu Lv, Xinxin Kong, Xiaoli Guo, Academy of Opto-Electronics, CAS (China)
Show Abstract
An optical flow-based method for velocity field of fluid flow estimation
Paper 10329-135
Time: 12:50 PM - 2:10 PM
Author(s): Grzegorz Glomb, Grzegorz Swirniak, Janusz Mroczka, Wroclaw Univ. of Technology (Poland)
Show Abstract
Phase detection model and method for SPR effect modulated by metallic thickness
Paper 10329-136
Time: 12:50 PM - 2:10 PM
Author(s): Qinggang Liu, Yang Li, Zirui Qin, Chong Yue, Tianjin Univ. (China)
Show Abstract
Combined narrowband imager-spectrograph with volume-phase holographic gratings
Paper 10329-137
Time: 12:50 PM - 2:10 PM
Author(s): Eduard R. Muslimov, Aix-Marseille Univ. (France), Kazan National Research Technical Univ. named after A.N. Tupolev (Russian Federation); Sergei N. Fabrika, Special Astrophysical Observatory (Russian Federation); Gennady G. Valyavin, Special Astrophysical Observatory (Russian Federation)
Show Abstract
Heterodyne grating interferometry based on sinusoidal phase modulation for displacement measurement
Paper 10329-138
Time: 12:50 PM - 2:10 PM
Author(s): Ju-Yi Lee, National Central Univ. (Taiwan); Hung-Lin Hsieh, National Taiwan Univ. of Science and Technology (Taiwan); Zhi-Ying Lin, National Central Univ. (Taiwan)
Show Abstract
Optical exploration of micro/nanoscale irregularities created on metallic surfaces by femtosecond laser irradiation
Paper 10329-139
Time: 12:50 PM - 2:10 PM
Author(s): Hamid Ahmadi, Mahmoud Mollabashi, Iran Univ. of Science and Technology (Iran, Islamic Republic of); Sepehr Razi, Urmia Univ. (Iran, Islamic Republic of)
Show Abstract
Universal dynamic goniometer for rotary encoders
Paper 10329-140
Time: 12:50 PM - 2:10 PM
Author(s): Nikolai V. Smirnov, Svjatoslav M. Latyev, Anastasiia I. Naumova, ITMO Univ. (Russian Federation)
Show Abstract
Estimation of clearances in the design and adjustment of barrel type lens systems
Paper 10329-141
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
Self-tunable phase shifting algorithm for images with additive noise
Paper 10329-142
Time: 12:50 PM - 2:10 PM
Author(s): Gastón A. Ayubi, Univ. de la República (Uruguay)
Show Abstract
Revealing features of different optical shaping technologies by a point diffraction interferometer
Paper 10329-143
Time: 12:50 PM - 2:10 PM
Author(s): Nikolay B. Voznesenskiy, Mariia Voznesenskaia, Diwaker Jha, Difrotec OÜ (Estonia); Heidi Ottovaere, Vrije Universiteit Brussel, Institute of Micromechanics and Photonics (Belgium); Małgorzata Kujawińska, Maciej Trusiak, Kamil Liżewski, Warsaw University of Technology (Poland)
Show Abstract
Pointwise intensity-based dynamic speckle analysis with binary patterns
Paper 10329-144
Time: 12:50 PM - 2:10 PM
Author(s): Elena Stoykova, Georgi Mateev, Dimana Nazarova, Nataliya Berberova, Institute of Optical Materials and Technologies (Bulgaria); Branimir Ivanov, Central Lab. of Optical Storage and Processing of Information (Bulgaria)
Show Abstract
Full-field wafer warpage measurement technique
Paper 10329-145
Time: 12:50 PM - 2:10 PM
Author(s): Hung-Lin Hsieh, National Taiwan Univ. of Science and Technology (Taiwan); Ju-Yi Lee, National Central Univ. (Taiwan); Yong-Guang Huang, An-Jie Liang, Bo-Yen Sun, National Taiwan Univ. of Science and Technology (Taiwan)
Show Abstract
Vibration compensated high-resolution scanning white-light Linnik-interferometer
Paper 10329-147
Time: 12:50 PM - 2:10 PM
Author(s): Stanislav Tereschenko, Peter Lehmann, Pascal Gollor, Peter Kühnhold, Univ. Kassel (Germany)
Show Abstract
Modern approaches for optical multisensor systems design
Paper 10329-148
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
Features of the estimation of temperature distribution on the bead formed by the laser aided metal powder deposition
Paper 10329-149
Time: 12:50 PM - 2:10 PM
Author(s): Yuri N. Zavalov, Alexander V. Dubrov, Fikret K. Mirzade, Vladimir D. Dubrov, Institute on Laser and Information Technologies (Russian Federation)
Show Abstract
Optical fiber sensors measurement system and special fibers improvement
Paper 10329-150
Time: 12:50 PM - 2:10 PM
Author(s): Michal Jelínek, Jan Hrabina, Miroslava Hola, Václav Hucl, Martin Cizek, Simon Rerucha, Josef Lazar, Bretislav Mikel, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Show Abstract
Broadband interferometric characterisation of nano-positioning stages with sub-10 pm resolution
Paper 10329-151
Time: 12:50 PM - 2:10 PM
Author(s): Zhi Li, Uwe Brand, Helmut Wolff, Ludger Koenders, Physikalisch-Technische Bundesanstalt (Germany); Andrew Yacoot, Prabowo Puranto, National Physical Lab. (United Kingdom)
Show Abstract
Signal-to-noise ratio for mode-mode fiber interferometer
Paper 10329-153
Time: 12:50 PM - 2:10 PM
Author(s): Oleg Kotov, Peter the Great Saint-Petersburg Polytechnic University (Russian Federation); Ivan Chapalo, Saint-Petersburg State Polytechnical Univ. (Russian Federation)
Show Abstract
The design of the layout of faceted multi-channel electro-optical spatial coordinates measuring instrument for point-like bright objects
Paper 10329-154
Time: 12:50 PM - 2:10 PM
Author(s): Vladislav Repin, Elena Gorbunova, Aleksandr Chertov, Valery V. Korotaev, ITMO Univ. (Russian Federation)
Show Abstract
Wide-angle solar-blind UV optical system for power transmission line monitoring
Paper 10329-155
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
Analysis and 3D inspection system of drill holes in aeronautical surfaces
Paper 10329-156
Time: 12:50 PM - 2:10 PM
Author(s): Ricardo Rubio Oliver, Luis Granero Montagud, Martín Sanz Sabater, Javier García Monreal, Vicente Micó Serrano, Univ. de València (Spain)
Show Abstract
Measuring horizontal atmospheric turbulence at ground level from optical turbulence generator (OTG) using a 1D sensor
Paper 10329-157
Time: 12:50 PM - 2:10 PM
Author(s): Omar J. Tíjaro Rojas, Yezid Torres Moreno, Univ. Industrial de Santander (Colombia); William T. Rhodes, Florida Atlantic University (United States)
Show Abstract
Absolute measurement of surface figure of rotationally symmetrical aspheric surfaces
Paper 10329-158
Time: 12:50 PM - 2:10 PM
Author(s): Wei-Cheng Lin, Instrument Technology Research Ctr. (Taiwan)
Show Abstract
The analysis of methods to calculate the measurement error of coordinates for optical-electronic system for real-time position control of roof's supporting structure
Paper 10329-159
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing
Paper 10329-160
Time: 12:50 PM - 2:10 PM
Author(s): Vicente Micó Serrano, José Angel Picazo-Bueno, Univ. de València (Spain); Zeev Zalevsky, Bar-Ilan Univ. (Israel); Javier García, Carlos Ferreira, Univ. de València (Spain)
Show Abstract
Water turbidity optical meter using optical fiber array for topographical distribution analysis
Paper 10329-161
Time: 12:50 PM - 2:10 PM
Author(s): Kussay N. M. Al-Zubaidi, Mohamad Zubir Mat Jafri, Stephenie Yeoh, Univ. Sains Malaysia (Malaysia)
Show Abstract
Uncertainty analysis of optical components absorption coefficient measurement using an intra-cavity device
Paper 10329-162
Time: 12:50 PM - 2:10 PM
Author(s): Baozhu Yan, Wenguang Liu, Qiong Zhou, Shaojun Du, Yi Yang, National Univ. of Defense Technology (China)
Show Abstract
Invariant electro-optical system for deflection measurement of floating docks
Paper 10329-163
Time: 12:50 PM - 2:10 PM
Author(s): Alexey A. Gorbachev, Anh Phuong Hoang, ITMO Univ. (Russian Federation)
Show Abstract
Numerical analysis of nonlinear multimode interference waveguide as a refractive index sensor
Paper 10329-165
Time: 12:50 PM - 2:10 PM
Author(s): Stephenie Yeoh, Kussay N. Mutter, Mohamad Zubir Mat Jafri, Univ. Sains Malaysia (Malaysia)
Show Abstract
Investigation of the relative orientation of the system of optical sensors to monitor the technosphere objects
Paper 10329-166
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
Evaluation of laser ablation crater relief by white light micro interferometer
Paper 10329-167
Time: 12:50 PM - 2:10 PM
Author(s): Igor P. Gurov, Mikhail V. Volkov, Ekaterina V. Zhukova, Nikita Ivanov, Nikita Margaryants, Andrey Potemkin, Andrey Samokhvalov, Svetlana Shelygina, ITMO Univ. (Russian Federation)
Show Abstract
Relationship of parameters of optical equisignal zone system for providing constant static characteristics
Paper 10329-168
Time: 12:50 PM - 2:10 PM
Author(s): Anton A. Maraev, Aleksandr N. Timofeev, ITMO Univ. (Russian Federation); Vadim F. Gusarov, Sergey V. Mednikov, Aleksandr A. Klimov, ITMO University (Russian Federation)
Show Abstract
Estimation of the particle concentration in hydraulic liquid by the in-line automatic particle counter based on the CMOS image sensor
Paper 10329-169
Time: 12:50 PM - 2:10 PM
Author(s): Dmitriy V. Kornilin, Ilya A. Kudryavtsev, Samara Univ. (Russian Federation); Alison J. McMillan, Ardeshir Osanlou, Ian Ratcliffe, Glyndwr University (United Kingdom)
Show Abstract
The research of the cross-links effect influence in the color matrix photodetector on an error of the air tract vertical temperature gradient determination
Paper 10329-170
Time: 12:50 PM - 2:10 PM
Author(s): Ivan S. Nekrylov, Maksim A. Kleshchenok, Aleksandr N. Timofeev, Elena Sycheva, Vadim Gusarov, ITMO Univ. (Russian Federation)
Show Abstract
Parameter optimization of measuring and control elements in the monitoring systems of complex technical objects
Paper 10329-171
Time: 12:50 PM - 2:10 PM
Author(s): Ivan S. Nekrylov, Valery V. Korotaev, Anastasia Blokhina, Maksim A. Kleshchenok, ITMO Univ. (Russian Federation)
Show Abstract
Deep sub-wavelength metrology for advanced defect classification
Paper 10329-172
Time: 12:50 PM - 2:10 PM
Author(s): Peter van der Walle, TNO (Netherlands); Esther Kramer, TNO (Netherlands), Technische Univ. Delft (Netherlands); Jacques C. J. van der Donck, Wouter F. W. Mulckhuyse, Loek Nijsten, Felipe A. Bernal Arango, Anton de Jong, Elfi van Zeijl, Helma Spruit, Hans van den Berg, TNO (Netherlands); Gaurav Nanda, Anja van Langen-Suurling, Paul F. A. Alkemade, Silvania Pereira, Technische Univ. Delft (Netherlands); Diederik J. Maas, TNO (Netherlands)
Show Abstract
Effects of the density and homogeneity in NIRS crop moisture estimation
Paper 10329-173
Time: 12:50 PM - 2:10 PM
Author(s): Nicola Lenzini, Luigi Rovati, Univ. degli Studi di Modena e Reggio Emilia (Italy); Luca Ferrari, CNH Industrial Italia (Italy)
Show Abstract
System testing for the Fresnel-lens-based optical concentrator for photovoltaic (CPV) solar energy harvesting
Paper 10329-174
Time: 12:50 PM - 2:10 PM
Author(s): Anuar B. Beltran Gonzalez, Guillermo Garcia-Torales, Univ. de Guadalajara (Mexico); Marija Strojnik Scholl, Univ. de Guadalajara (Mexico), Centro de Investigaciones en Óptica, A.C. (Mexico); Juan Milton Garduno, Gautier Veroone, Mixbaal SA de CV (Mexico)
Show Abstract
Direct fabrication of polymer micro-lens array
Paper 10329-175
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
Optical fibre-based reflective displacement sensor: computer modelling and application to impact detection in aeronautical structures
Paper 10329-176
Time: 12:50 PM - 2:10 PM
Author(s): Josu Amorebieta, Iker Garcia, Gaizaka Durana, Gotzon Aldabaldetreku, Joseba Zubia, Univ. del País Vasco (Spain); Idurre Sáez-Ocáriz, Aertonautical Technologies Ctr. (Spain)
Show Abstract
Characterization of laser damage performance of fused silica using photothermal absorption technique
Paper 10329-177
Time: 12:50 PM - 2:10 PM
Author(s):
Show Abstract
Compensation of optical system distortion and image perspective deformations for the projection lens
Paper 10329-178
Time: 12:50 PM - 2:10 PM
Author(s): Anastasiia Burtseva, Kseniia V. Ezhova, Oleg V. Trifanov, ITMO Univ. (Russian Federation)
Show Abstract
A flexible 3D laser scanning system using a robotic arm
Paper 10329-180
Time: 12:50 PM - 2:10 PM
Author(s): Zixuan Fei, Xi’an Jiaotong Univ. (China); Xiang Zhou, Xi'an Jiaotong Univ. (China); Xiaofei Gao, Xi’an Jiaotong Univ. (China); Guanliang Zhang, Xi'an Jiaotong Univ. (China)
Show Abstract
A high-performance fringe pattern generation method for fringe projection profilometry
Paper 10329-181
Time: 12:50 PM - 2:10 PM
Author(s): Tao Yang, Xi'an Jiaotong Univ. (China); Huanhuan Li, Xi’an Jiaotong Univ. (China); Xiang Zhou, Yuqin Li, Jiayu Guo, Xi'an Jiaotong Univ. (China); Xiaofei Gao, Xi’an Jiaotong Univ. (China)
Show Abstract
A high-speed full-field profilometry with coded laser strips projection
Paper 10329-182
Time: 12:50 PM - 2:10 PM
Author(s): Guanliang Zhang, Xiang Zhou, Rui Jin, Chang da Xu, Dong Li, Xi'an Jiaotong Univ. (China)
Show Abstract
A hybrid structured-light measurement using a laser projector
Paper 10329-183
Time: 12:50 PM - 2:10 PM
Author(s): Jiayu Guo, Xiang Zhou, Dong Li, Chao Wang, Zixuan Fei, Huanhuan Li, Xi’an Jiaotong Univ. (China)
Show Abstract
Session 7:
Fringe Projection II
Tuesday 27 June 2017
2:10 PM - 3:30 PM
Session Chair:
Eberhard Manske, Technische Univ. Ilmenau (Germany)
Suppression of contrast-related artefacts in phase-measuring structured light techniques
Paper 10329-28
Time: 2:10 PM - 2:30 PM
Author(s): Jan Burke, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany); Liang Zhong, Karlsruher Institut für Technologie (Germany)
Show Abstract
3D geometry measurement of hot cylindric specimen using structured light
Paper 10329-29
Time: 2:30 PM - 2:50 PM
Author(s): Lorenz Quentin, Rüdiger Beermann, Andreas Pösch, Eduard Reithmeier, Markus Kästner, Leibniz Univ. Hannover (Germany)
Show Abstract
Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing
Paper 10329-31
Time: 2:50 PM - 3:10 PM
Author(s): Dongliang Zheng, Southeast Univ. (China); Qian Kemao, Nanyang Technological Univ. (Singapore); Feipeng Da, Southeast Univ. (China); Hock Soon Seah, Nanyang Technological Univ. (Singapore)
Show Abstract
Experimental comparison of photogrammetry for additive manufactured parts with and without laser speckle projection
Paper 10329-76
Time: 3:10 PM - 3:30 PM
Author(s): Danny Sims-Waterhouse, Patrick Bointon, Samanta Piano, Richard K. Leach, The Univ. of Nottingham (United Kingdom)
Show Abstract
Coffee Break 3:30 PM - 4:00 PM
Session 8:
Special Session: Spectroscopic Techniques in Industrial and Astronomical Applications
Tuesday 27 June 2017
4:00 PM - 6:00 PM
Session Chair:
Philipp Huke, Georg-August-Univ. Göttingen (Germany)
Comparison of astrophysical Fabry-Perots with respect to the requirements of HIRES
Paper 10329-32
Time: 4:00 PM - 4:20 PM
Author(s): Sebastian Schäfer, Philipp Huke, Ansgar Reiners, Georg-August-Univ. Göttingen (Germany); Francesco Pepe, Marco Riva, Bruno Chazelas, Observatoire de Genève (Switzerland); Piotr Maslowski, Grzegorz Kowzan, Nicolaus Copernicus Univ. (Poland)
Show Abstract
Comparison of astrophysical laser frequency combs with respect to the requirements of HIRES
Paper 10329-33
Time: 4:20 PM - 4:40 PM
Author(s): Jake M. Charsley, Richard A. McCracken, Derryck T. Reid, Heriot-Watt Univ. (United Kingdom); Grzegorz Kowzan, Piotr Maslowski, Nicolaus Copernicus Univ. (Poland); Ansgar Reiners, Philipp Huke, Georg-August-Univ. Göttingen (Germany)
Show Abstract
The end-to-end simulator for the E-ELT HIRES high resolution spectrograph
Paper 10329-34
Time: 4:40 PM - 5:00 PM
Author(s): Matteo Genoni, Marco Landoni, M. Riva, Giorgio Pariani, INAF - Osservatorio Astronomico di Brera (Italy); Elena Mason, Paolo Di Marcantonio, INAF - Osservatorio Astronomico di Trieste (Italy); Karen Disseau, Georg-August-Univ. Göttingen (Germany); Igor Di Varano, Leibniz-Institut für Astrophysik Potsdam (Germany); Oscar Gonzalez, UK Astronomy Technology Ctr. (United Kingdom); Phillipp Huke, Georg-August-Univ. Göttingen (Germany); Heidi Korhonen, Niels Bohr Institute – Dark Cosmology Center (Denmark); Gianluca Li Causi, INAF - Osservatorio Astronomico di Roma (Italy)
Show Abstract
Calibration of astronomical infra-red spectrographs: from VLT/CRIRES to the E-ELT
Paper 10329-35
Time: 5:00 PM - 5:20 PM
Author(s): Ulf Seemann, Georg-August-Univ. Göttingen (Germany); Paul Bristow, Claudio Cumani, Reinhold J. Dorn, European Southern Observatory (Germany); Roman Follert, Artie P. Hatzes, Thüringer Landessternwarte Tautenburg (Germany); Ulrike Heiter, Uppsala Univ. (Sweden); Renate Hinterschuster, Derek J. Ives, Yves Jung, Barbara Klein, European Southern Observatory (Germany); Alexis Lavail, Uppsala Univ. (Sweden); Jean-Louis Lizon, European Southern Observatory (Germany); Thomas Marquart, Uppsala Univ. (Sweden); Ignacio Molina-Conde, European Southern Observatory (Germany); Ernesto Oliva, INAF - Osservatorio Astrofisico di Arcetri (Italy); Jérôme Paufique, European Southern Observatory (Germany); Nikolai E. Piskunov, Uppsala Univ. (Sweden); Ansgar Reiners, Georg-August-Univ. Göttingen (Germany); Eric Stempels, Uppsala Univ. (Sweden)
Show Abstract
Atomic layer sensitive in-situ plasma etch depth control with reflectance anisotropy spectroscopy (RAS)
Paper 10329-36
Time: 5:20 PM - 5:40 PM
Author(s): Christoph Döring, Ann-Kathrin Kleinschmidt, Lars Barzen, Johannes Strassner, Henning Fouckhardt, Technische Univ. Kaiserslautern (Germany)
Show Abstract
Photo-vibrational spectroscopy using quantum cascade laser and laser Doppler vibrometer
Paper 10329-37
Time: 5:40 PM - 6:00 PM
Author(s): Huan Liu, Qi Hu, Jiecheng Xie, Yu Fu, Nanyang Technological Univ. (Singapore)
Show Abstract
Wednesday 28 June Show All Abstracts
Session 9:
High-Resolution Profiling I
Wednesday 28 June 2017
8:10 AM - 10:00 AM
Session Chair:
Paul C. Montgomery, Univ. de Strasbourg (France)
Three-dimensional Dammann confocal microscopy (Invited Paper)
Paper 10329-38
Time: 8:10 AM - 8:40 AM
Author(s): Changhe Zhou, Shanghai Institute of Optics and Fine Mechanics (China)
Show Abstract
Optical inspection of hidden MEMS structures
Paper 10329-39
Time: 8:40 AM - 9:00 AM
Author(s): Johann Krauter, Marc Gronle, Institut für Technische Optik (Germany); Wolfgang Osten, Univ. Stuttgart (Germany)
Show Abstract
Confocal unrolled areal measurements of cylindrical surfaces
Paper 10329-40
Time: 9:00 AM - 9:20 AM
Author(s): Aitor Matilla Ayala, Carlos Bermudez, Jordi Mariné, David Martinez, Sensofar-Tech, S.L. (Spain); Cristina Cadevall, Roger Artigas, Sensofar-Tech, S.L. (Spain), UPC-CD6 (Spain)
Show Abstract
Transfer characteristics of optical profilers with respect to rectangular edge and step height measurement
Paper 10329-41
Time: 9:20 AM - 9:40 AM
Author(s): Weichang Xie, Sebastian Hagemeier, Univ. Kassel (Germany); Jörg Bischoff, Rostyslav Mastylo, Eberhard Manske, Technische Univ. Ilmenau (Germany); Peter Lehmann, Univ. Kassel (Germany)
Show Abstract
Focus-variation microscopy for measurement of surface roughness and autocorrelation length
Paper 10329-42
Time: 9:40 AM - 10:00 AM
Author(s): Erich N. Grossman, National Institute of Standards and Technology (United States)
Show Abstract
Coffee Break 10:00 AM - 10:30 AM
SPIE Plenary Session
Wednesday 28 June 2017
10:30 AM - 11:25 AM
Location: 1

Optical Metrology/Digital Optical Technologies 2017 Plenary Session


Metasurface Diffractive Optics
Federico Capasso, Harvard Univ. (United States)

For details, please see page 5-6 in the printed programme or visit http://www.spie.org/conferences-and-exhibitions/optical-metrology/special-events
Session 10:
High-Resolution Profiling II
Wednesday 28 June 2017
11:30 AM - 1:00 PM
Session Chair:
Juergen W. Czarske, TU Dresden (Germany)
Sub-diffraction surface topography measurement using a microsphere-assisted Linnik interferometer (Invited Paper)
Paper 10329-43
Time: 11:30 AM - 12:00 PM
Author(s): Paul C. Montgomery, Sylvain Lecler, Audrey Leong-Hoï, Univ. de Strasbourg (France); Stéphane Perrin, Pierre Pfeiffer, Univ. de Strasbourg (France)
Show Abstract
Measurement, certification and use of step-height calibration specimens in optical metrology
Paper 10329-44
Time: 12:00 PM - 12:20 PM
Author(s): Peter J. de Groot, Danette Fitzgerald, Zygo Corporation (United States)
Show Abstract
Surface profile measurement by using the integrated Linnik WLSI and confocal microscope system
Paper 10329-45
Time: 12:20 PM - 12:40 PM
Author(s): Wei-Chung Wang, Ming-Hsing Shen, National Tsing Hua Univ. (Taiwan); Chi-Hung Hwang, Instrument Technology Research Ctr. (Taiwan); Yun-Ting Yu, Tzu-Fong Wang, National Tsing Hua Univ. (Taiwan)
Show Abstract
Super-resolution photonic nanojet interferometry: photonic nanojet interaction with a polymer sample
Paper 10329-119
Time: 12:40 PM - 1:00 PM
Author(s): Maria Gritsevich, Göran Maconi, Anton Nolvi, Ivan Kassamakov, Antti Penttilä, Karri Muinonen, Edward Hæggström, Univ. of Helsinki (Finland)
Show Abstract
Lunch Break 1:00 PM - 2:00 PM
Session 11:
Joint Session I: High-Precision Measurement of Optical Components and Systems
Wednesday 28 June 2017
2:00 PM - 3:30 PM
Location: Saal 21
Session Chair:
Christof Pruss, Institut für Technische Optik (Germany)

Joint Session with EOS conference on Manufacturing and Testing of Optical Components
Light scattering characterization of high-performance optical components: influence of roughness, defects, and coatings (Invited Paper)
Paper 10329-200
Time: 2:00 PM - 2:30 PM
Author(s): Sven Schröder, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Show Abstract
Combination of a fast white-light interferometer with a phase shifting interferometric line sensor for form measurements of precision components
Paper 10329-47
Time: 2:30 PM - 2:50 PM
Author(s): Sören Laubach, Gerd Ehret, Physikalisch-Technische Bundesanstalt (Germany); Jörg Riebling, Peter Lehmann, Univ. Kassel (Germany)
Show Abstract
Wide-ranging roughness analysis of optical surfaces
Paper 10329-201
Time: 2:50 PM - 3:10 PM
Author(s): Nadja Feide, Luisa Coriand, Sven Schröder, Andreas Tünnermann, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Show Abstract
Birefringence measurement in complex optical systems
Paper 10329-48
Time: 3:10 PM - 3:30 PM
Author(s): Holger Knell, Leica Microsystems GmbH (Germany); Hans-Martin Heuck, Leica Microsystems CMS GmbH (Germany)
Show Abstract
Coffee Break 3:30 PM - 4:00 PM
Session 12:
Joint Session II: High-Precision Measurement of Optical Components and Systems
Wednesday 28 June 2017
4:00 PM - 6:10 PM
Location: Saal 21
Session Chair:
Marcus Trost, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

Joint Session with EOS conference on Manufacturing and Testing of Optical Components
Dynamic interferometry: measurement of space optics and structures (Invited Paper)
Paper 10329-49
Time: 4:00 PM - 4:30 PM
Author(s): James E. Millerd, Michael north-morris, 4D Technology Corp. (United States)
Show Abstract
In situ laser polishing optimization method: control of LASer Surface Optimisation (C-Lasso)
Paper 10329-202
Time: 4:30 PM - 4:50 PM
Author(s): Rolf Rascher, Hochschule Deggendorf Technologiecampus Teisnach (Germany); Christian Vogt, Technische Hochschule Deggendorf (Germany); Oliver W. Fähnle, FISBA AG (Switzerland)
Show Abstract
Preliminary results of a new proposal for objective human independent striae measurement
Paper 10329-50
Time: 4:50 PM - 5:10 PM
Author(s): Steffen Reichel, Pforzheim Univ. (Germany), Hochschule Darmstadt (Germany); Peter Hartmann, Uwe Petzold, SCHOTT AG (Germany); Christina Lempa, Eckelmann AG (Germany)
Show Abstract
Wavefront evaluation method based on imaging performance: relative wavefront gradient deviation
Paper 10329-203
Time: 5:10 PM - 5:30 PM
Author(s): Bin Xuan, Jingjiang Xie, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Show Abstract
Development of metrology for freeform optics in reflection mode
Paper 10329-51
Time: 5:30 PM - 5:50 PM
Author(s): Dali R. Burada, Kamal K. Pant, Vinod Mishra, Indian Institute of Technology Delhi (India); Mohamed Bichra, Technische Univ. Ilmenau (Germany); Gufran S. Khan, Indian Institute of Technology Delhi (India); Stefan Sinzinger, Technische Univ. Ilmenau (Germany); Chandra Shakher, Indian Institute of Technology Delhi (India)
Show Abstract
Metrology for freeform and wafer level optics by UA3P
Paper 10329-204
Time: 5:50 PM - 6:10 PM
Author(s): Dieter Ramm, Tomofumi Morishita, Panasonic Automotive & Industrial Systems Europe GmbH (Germany); Keiji Kubo, Panasonic Factory Solutions Co., Ltd. (Japan)
Show Abstract
Thursday 29 June Show All Abstracts
Session 13:
Speckle Metrology
Thursday 29 June 2017
8:40 AM - 10:00 AM
Session Chair:
Sen Han, Univ. of Shanghai for Science and Technology (China)
Deformation measurements by ESPI of the surface of a heated mirror and comparison with numerical model
(Canceled)
Paper 10329-52
Time: 8:20 AM - 8:40 AM
Author(s):
Show Abstract
Reduction of phase singularities in a speckle Michelson setup
Paper 10329-53
Time: 8:40 AM - 9:00 AM
Author(s): Klaus Mantel, Max-Planck-Institut für die Physik des Lichts (Germany); Vanusch Nercissian, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
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Speckle-interferometric measurement system of 3D deformation to obtain thickness changes of thin specimen under tensile loads
Paper 10329-54
Time: 9:00 AM - 9:20 AM
Author(s): Robert Kowarsch, Jiajun Zhang, Carmen Sguazzo, Stefan Hartmann, Christian Rembe, Technische Univ. Clausthal (Germany)
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Uncertainty of scattered light roughness measurements based on speckle correlation methods
Paper 10329-55
Time: 9:20 AM - 9:40 AM
Author(s): Stefan Patzelt, Dirk Stöbener, Gerald Ströbel, Andreas Fischer, Bremer Institut für Messtechnik, Automatisierung und Qualitätswissenschaft (BIMAQ) (Germany)
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Pre-treatment for preventing degradation of measurement accuracy by speckle noise in speckle interferometry
Paper 10329-56
Time: 9:40 AM - 10:00 AM
Author(s): Yasuhiko Arai, Kansai Univ. (Japan)
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Coffee Break 10:00 AM - 10:20 AM
Session 14:
In-situ and Nondestructive Testing I
Thursday 29 June 2017
10:20 AM - 12:30 PM
Session Chair:
Changhe Zhou, Shanghai Institute of Optics and Fine Mechanics (China)
Optical residual stress measurement in TFT-LCD panels (Invited Paper)
Paper 10329-57
Time: 10:20 AM - 10:50 AM
Author(s): Wei-Chung Wang, Po-Chi Sung, National Tsing Hua Univ. (Taiwan)
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Calibration of the incident beam in a reflective topography measurement from an unknown surface
Paper 10329-58
Time: 10:50 AM - 11:10 AM
Author(s): Tobias Binkele, David Hilbig, Friedrich Fleischmann, Thomas Henning, Hochschule Bremen Univ. of Applied Sciences (Germany)
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Error influences of the shear element in interferometry for form characterization of optics
Paper 10329-59
Time: 11:10 AM - 11:30 AM
Author(s): Jan-Hendrik Hagemann, Physikalisch-Technische Bundesanstalt (Germany); Claas Falldorf, Bremer Institut für angewandte Strahltechnik GmbH (Germany); Gerd Ehret, Physikalisch-Technische Bundesanstalt (Germany); Ralf B. Bergmann, Bremer Institut für angewandte Strahltechnik GmbH (Germany)
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Automated NDT in a production environment using Dantec dynamics' robotic shearography
Paper 10329-60
Time: 11:30 AM - 11:50 AM
Author(s):
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An endoscopic shearography system with radial sensitivity for inner inspection of adhesion faults in composite material pipes
Paper 10329-61
Time: 11:50 AM - 12:10 PM
Author(s): Mauro E. Benedet, Fabiano J. Macedo, Analucia V. Fantin, Daniel P. Willemann, F. A. A. Silva, Univ. Federal de Santa Catarina (Brazil); S. D. Soares, CENPES - PETROBRAS (Brazil); Armando Albertazzi Gonçalves, Univ. Federal de Santa Catarina (Brazil)
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Bulk strain solitons as a tool for determination of the third order elastic moduli of composite materials
Paper 10329-62
Time: 12:10 PM - 12:30 PM
Author(s): Irina V. Semenova, Andrey V. Belashov, Ioffe Institute (Russian Federation); Fedor E. Garbuzov, Ioffe Institute (Russian Federation), Saint-Petersburg State Polytechnical Univ. (Russian Federation); Alexander M. Samsonov, Ioffe Institute (Russian Federation); Alexander A. Semenov, Ioffe Institute (Russian Federation), Saint-Petersburg State Polytechnical Univ. (Russian Federation)
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Lunch Break 12:30 PM - 1:30 PM
Session 15:
In-situ and Nondestructive Testing II
Thursday 29 June 2017
1:30 PM - 3:20 PM
Session Chair:
Wei-Chung Wang, National Tsing Hua Univ. (Taiwan)
Fiber Bragg grating sensors in harsh environments: considerations and industrial monitoring applications (Invited Paper)
Paper 10329-63
Time: 1:30 PM - 2:00 PM
Author(s): Alexis Mendez, Micron Optics, Inc. (United States)
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Measurement uncertainty budget of an interferometric flow velocity sensor
Paper 10329-64
Time: 2:00 PM - 2:20 PM
Author(s): Mike Bermuske, Lars Büttner, Jürgen W. Czarske, TU Dresden (Germany)
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Laser speckle velocimetry for robot manufacturing
Paper 10329-65
Time: 2:20 PM - 2:40 PM
Author(s): Thomas O. H. Charrett, Yashwanth K. Bandari, Florent Michel, Jialuo Ding, Stewart W. Williams, Ralph P. Tatam, Cranfield Univ. (United Kingdom)
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Non-invasive seedingless measurements of the flame transfer function using high-speed camera-based laser vibrometry
Paper 10329-66
Time: 2:40 PM - 3:00 PM
Author(s): Johannes Gürtler, TU Dresden (Germany); Felix Greiffenhagen, Jakob Woisetschläger, Technische Univ. Graz (Austria); Daniel Haufe, Jürgen W. Czarske, TU Dresden (Germany)
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Application of GPU-based, highly parallelized algorithms for the estimation of electromagnetic multi-layer interactions
Paper 10329-46
Time: 3:00 PM - 3:20 PM
Author(s): François Maurice Torner, Abdullah Karatas, Matthias Eifler, Indek Raid, Jörg Seewig, Technische Univ. Kaiserslautern (Germany)
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Optical rotor-blade deformation measurements using a rotating camera system
(Canceled)
Paper 10329-67
Time: 3:20 PM - 3:20 PM
Author(s):
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Coffee Break 3:40 PM - 4:00 PM
Session 16:
In-situ and Nondestructive Testing III
Thursday 29 June 2017
4:00 PM - 5:20 PM
Session Chair:
Armando Albertazzi Gonçalves, Univ. Federal de Santa Catarina (Brazil)
In-situ measurement with deflectometric acquisition of large optical surfaces DaOS using vignetting field stop VFS procedure
Paper 10329-69
Time: 4:00 PM - 4:20 PM
Author(s): Engelbert Hofbauer, Technische Hochschule Deggendorf (Germany), Hofbauer Optik Mess-&Prüftechnik (Germany); Rolf Rascher, Hochschule Deggendorf Technologiecampus Teisnach (Germany); Thomas Münch, STOCK Konstruktion GmbH (Germany); Jan-Peter P. Richters, Berliner Glas KGaA Herbert Kubatz GmbH & Co. (Germany)
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3D interferometric shape measurement technique using coherent fiber bundles
Paper 10329-70
Time: 4:20 PM - 4:40 PM
Author(s): Hao Zhang, Robert Kuschmierz, Jürgen W. Czarske, TU Dresden (Germany)
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Interferometric fibre-optic curvature sensing for structural, directional vibration measurements
Paper 10329-71
Time: 4:40 PM - 5:00 PM
Author(s): Thomas Kissinger, Edmon Chehura, Stephen W. James, Ralph P. Tatam, Cranfield Univ. (United Kingdom)
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Subpixel edge estimation with lens aberrations compensation based on the iterative image approximation for high-precision thermal expansion measurements of solids
Paper 10329-72
Time: 5:00 PM - 5:20 PM
Author(s): Fedor M. Inochkin, Sergey K. Kruglov, Saint Petersburg State Univ. (Russian Federation); Igor G. Bronshtein, ITMO Univ. (Russian Federation); Tatiana A. Kompan, D.I. Mendeleyev Institute for Metrology (Russian Federation); Sergey V. Kondratjev, Alexander S. Korenev, Nickolay F. Pukhov, D.I.Mendeleyev Institute for Metrology (Russian Federation)
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